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Autor:
Yi-Tsun Yen, 顏一存
97
This paper applies the Six Sigma DMAIC methodology to improve circuit quality of IC carrier. First of all, we determined the critical quality characteristics by Pareto chart, and then confirmed the measurement system which is suitable for our
This paper applies the Six Sigma DMAIC methodology to improve circuit quality of IC carrier. First of all, we determined the critical quality characteristics by Pareto chart, and then confirmed the measurement system which is suitable for our
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/74677284011565169911