Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Yi-Hao Shi"'
Publikováno v:
Journal of Geophysical Research: Earth Surface. 127
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1403ffc5713f53c45a86c2028439591a
https://doi.org/10.1029/2021jf006372
https://doi.org/10.1029/2021jf006372
Autor:
Cai-Jun Zheng, Jiansheng Jie, Si-Yi Huang, Xiaohong Zhang, Yi-Hao Shi, Jie Mao, Zhibin Shao, Bingchang Zhang
Publikováno v:
Advanced materials (Deerfield Beach, Fla.). 33(24)
Single-crystalline silicon (sc-Si) is the dominant semiconductor material for the modern electronics industry. Despite their excellent photoelectric and electronic properties, the rigidity, brittleness, and nontransparency of commonly used silicon wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a0d676f97ddcae4b7a6ce38498a7a29
https://pubmed.ncbi.nlm.nih.gov/33963781
https://pubmed.ncbi.nlm.nih.gov/33963781
Autor:
Yi-Hao Shih, 施益豪
102
The purpose of this study was to investigate the nanometer resolution laser interferometric optical light path alignment problems. Laser interferometer position measurement method with high precision and a working distance of up to tens of m
The purpose of this study was to investigate the nanometer resolution laser interferometric optical light path alignment problems. Laser interferometer position measurement method with high precision and a working distance of up to tens of m
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/47560995164016745336
Autor:
Yi-Hao Shie, 謝益豪
93
In indoor environment, the causes of degradation of wireless communication system are due to multi-path and co-channel interference. Besides, for the demands of multi-functions and compact size, the inner circuits are reduced relatively which
In indoor environment, the causes of degradation of wireless communication system are due to multi-path and co-channel interference. Besides, for the demands of multi-functions and compact size, the inner circuits are reduced relatively which
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/5uw83j