Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Yi Wu Chen"'
Publikováno v:
ACS Omega, Vol 9, Iss 10, Pp 11356-11365 (2024)
Externí odkaz:
https://doaj.org/article/b301412d4ec94c06a6e34925548feafb
Autor:
Yong-Jian Cai, Shu-Hua Xiao, Yi-wu Chen, Ze-Run Huang, Jia-Xiang Lin, Yong-Chang Guo, Yu-Qi Peng, Zhi-Hong Xie
Publikováno v:
Journal of Materials Research and Technology, Vol 23, Iss , Pp 5746-5759 (2023)
A fiber-reinforced polymer (FRP)-steel composite bars (FSCBs), with an inner steel core and outer FRP jacket, is a novel type of reinforcement designed to inherit good durability and ductility suitable for seawater sea sand concrete structures. The l
Externí odkaz:
https://doaj.org/article/c463206321c84bacb259ae745a1ffc5c
Publikováno v:
Buildings, Vol 14, Iss 3, p 681 (2024)
The application of alkali-activated concrete (AAC) shows promise in reducing carbon emissions within the construction industry. However, the pursuit of enhanced performance of AAC has led to a notable increase in carbon emissions, with alkali activat
Externí odkaz:
https://doaj.org/article/269e263ad9a24754a3b109470f8b3c61
Publikováno v:
ACS Omega. 7:40882-40891
Publikováno v:
Journal of Physics: Conference Series. 1087:062004
According to the actual needs of rehabilitation training after knee joint replacement surgery, and based on ergonomics, the idea of personification design and the basic design idea of force transfer between human body and exoskeleton are discussed, o
Publikováno v:
ICCE-TW
Conventional threshold-based method, such as nulling or clipping, is simple and effective for mitigation of impulsive noise (IN) in power-line commnucations (PLC) environment. However, we raise two issues for the threshold-based approach. First, for
Autor:
Yi-wu Chen, 陳宜武
95
Because of the rapidly advancement of semiconductor technology, the requirements of become more and more challenging. For utilization enhancement and cost reduction of DRAM FAB. From micron to nanometer of the technology in semiconductor manu
Because of the rapidly advancement of semiconductor technology, the requirements of become more and more challenging. For utilization enhancement and cost reduction of DRAM FAB. From micron to nanometer of the technology in semiconductor manu
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/06775876608496134292