Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Yevgen Burkov"'
Autor:
Konstantin Karavaev, Mohamed Torche, Yevgen Burkov, Dieter Schmeißer, Karsten Henkel, Rakesh Sohal, Carola Schwiertz
Publikováno v:
physica status solidi (a). 208:317-329
This work focuses on praseodymium oxide films as a high-k material on silicon and silicon carbide (SiC) in metal insulator semiconductor samples. The electrical results are correlated to spectroscopic findings on this material system. Strong interfac
Autor:
Stefan Wehner, Yevgen Burkov, Jürgen Küppers, Helmut R. Brand, Stefan Karpitschka, Dieter Schmeisser
Publikováno v:
Physica D: Nonlinear Phenomena. 239:746-751
We present experimental results on rare transitions between two states due to intrinsic noise between two states in a bistable surface reaction, namely the catalytic oxidation of CO on Pd(111) surfaces. The mean time scales involved are typically of
Autor:
Andriy Goryachko, Klaus Müller, Ioanna Paloumpa, Dieter Schmeißer, Karsten Henkel, Dipankar Mandal, Yevgen Burkov
Publikováno v:
Organic Electronics: Structural and Electronic Properties of OFETs
The functionality of organic devices is strongly influenced by their interfaces. We report on new microscopic methods for interface characterization of organic devices in operation mode. With photoemission electron microscopy (PEEM), a direct mapping
Publikováno v:
Thin Solid Films. 495:219-223
Photoemission-electron-microscopy (PEEM) is introduced as a tool for the characterization of organic electronic devices. PEEM-measurements are used for imaging as well as for spectroscopic analyses by illumination with light of a Hg-lamp (4.9 eV), a
Publikováno v:
Thin Solid Films. :291-294
Photoemission electron microscopy (PEEM) is used to study CuInS 2 surfaces. CuInS 2 (CIS) is used as polycrystalline absorber layer for thin film solar cells. A characterisation in terms of morphological information, elemental distribution, and of do
Autor:
Sergiy Minko, Dieter Schmeisser, Igor Tokarev, Alexander Sidorenko, Radim Krenek, Yevgen Burkov, Manfred Stamm
Publikováno v:
Macromolecules. 38:507-516
The fine structure of thin films of poly(styrene-block-4-vinylpyridine) copolymer−2-(4‘-hydroxybenzeneazo)benzoic acid (PS-PVP+HABA) assembly has been studied using the combination of atomic force microscopy, ellipsometry, X-ray reflectivity, GIS
Autor:
Carola Schwiertz, Markus Ratzke, Dieter Schmeißer, Klaus Müller, Yevgen Burkov, J. Köble, A. Goryachko, Juergen Reif
Publikováno v:
Synthetic Metals. 146:377-382
In order to optimize organic field effect transistors (OFETs), the characterisation of active-layer surfaces in terms of their roughness, chemical composition and distribution of surface potentials is important. We report on high-resolution microscop
Autor:
Patrick Hoffmann, Dieter Schmeißer, Yevgen Burkov, Ioanna Paloumpa, A. Yfantis, Dimitrios Yfantis
Publikováno v:
Surface and Coatings Technology. :308-312
We introduce a recently developed novel polypyrrole-based coating, which can be formed on the aluminium surface from an aqueous pyrrole solution of fluorozirconic and fluorotitanic acid neutralised with zinc oxide. The composite layer consists of pol
Publikováno v:
Thin Solid Films. :120-123
Thin films of KCN-etched CuInS 2 surfaces during an annealing procedure are investigated by photoelectron spectroscopy and scanning electron microscopy, combined with energy dispersive X-ray analysis. A significant deviation from stoichiometric compo
Publikováno v:
physica status solidi (c). 1:265-268
Praseodymium oxide (Pr2O3) as a hetero-oxide on SiC(0001) represents a promising semiconductor / high-K dielectric material combination. We prepared thin films (