Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Yermolenko Ye. O."'
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5, Pp 14-18 (2012)
The thermal mathematical model is used to estimate self-heating of semiconductor devices of various types during current-voltage characteristics measuring by the pulse method. The influence of self-heating on electrical parameters of semiconductor de
Externí odkaz:
https://doaj.org/article/74b49dd3776c49b18f20afc37605531a
