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pro vyhledávání: '"Yeong-Uk Son"'
Autor:
Tae-Hwa Kim, Chan-Hyeok Kwon, Dong-Sool Kim, Jeong-In Hwang, Yeong-Uk Son, Jang-Eok Kim, Sang-Oh Jeon
Publikováno v:
Korean Journal of Environmental Agriculture. 34:223-229
BACKGROUND: It is important to understand residual patterns of pesticides applied on crops for ensuring their safety in agricultural products. However, there are few studies on the residual patterns of pesticides in minor crops, which are small in cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::126f81826fcbbae5f9415a1495a67726
https://doi.org/10.5338/kjea.2015.34.3.29
https://doi.org/10.5338/kjea.2015.34.3.29
