Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yeon, Ali"'
Publikováno v:
Microelectronics International: An International Journal, 2008, Vol. 25, Issue 3, pp. 26-32.
Externí odkaz:
http://www.emeraldinsight.com/doi/10.1108/13565360810889593
Autor:
Shakaff, Ahmad, Yeon, Ali, Kamarudin, Kamarulzaman, Visvanathan, Retnam, Muhammad, Syed, Syed, Mamduh, Zakaria, Ammar, Munirah, Latifah
Publikováno v:
IOP Conference Series: Materials Science and Engineering; March 2018, Vol. 318 Issue: 1 p012049-012049, 1p