Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Yejin Chen"'
Publikováno v:
The International Journal of Advanced Manufacturing Technology. 118:3711-3724
Gantry-type machines are normally large-scaled manufacturing equipment, such as contact/noncontact measuring machines and cutting machines. Its actual positional shift of the functional point (FP) from the ideal position in three directional componen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::041abf3d1fd948ed9d43b96e7028bfad
https://doi.org/10.1007/s00170-021-08142-8
https://doi.org/10.1007/s00170-021-08142-8
Autor:
Yejin Chen
High temperature electronics find many applications such as down-hole drilling, aerospace, automotive and nuclear. Elevated temperatures are required for these applications to operate reliably. Electronics for drilling application explore oil wells b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7cea55b0316423fa26e5bda6e511ff0
https://doi.org/10.32657/10356/65457
https://doi.org/10.32657/10356/65457
Publikováno v:
ICCA
Stator winding insulation failure has been one of the major faults in electrical machines due to the degradation of winding insulation materials. The turn-to-turn short circuit fault indicates an early stage of insulation failure. This fault produces
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0480eddc49166a9774ae0411da4d539f
https://doi.org/10.1109/icca.2016.7505269
https://doi.org/10.1109/icca.2016.7505269
Publikováno v:
Robotics and Computer-Integrated Manufacturing. 23:276-284
A high precision micro-CMM (coordinate measuring machine) is under development. The expected measuring range is 25x25x10mm and the resolution is about 1nm. For the enhancement of machine accuracy, some new design concepts are introduced. The arch-bri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b650088188aa27f06dbf753dd2144d81
https://doi.org/10.1016/j.rcim.2006.02.007
https://doi.org/10.1016/j.rcim.2006.02.007
Publikováno v:
Measurement Science and Technology. 18:1710-1717
This paper presents two micro/nano level displacement sensors, which consist of a mini LDGI (linear diffraction grating interferometer) and a focus probe. These two sensors are integrated into the spindle system of a micro/nano-CMM. This micro/nano s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de96d8e8d9298b2269e2831848444172
https://doi.org/10.1088/0957-0233/18/6/s07
https://doi.org/10.1088/0957-0233/18/6/s07
Publikováno v:
Measurement Science and Technology. 17:524-532
A high-precision and low-cost micro-CMM (coordinate measuring machine) is under development. The expected measuring range is 25 × 25 × 10 mm3 and the resolution is 1 nm. In order to enhance the structural accuracy, some new ideas are integrated int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0257a0a4925700988f796d600d31f02
https://doi.org/10.1088/0957-0233/17/3/s12
https://doi.org/10.1088/0957-0233/17/3/s12
Publikováno v:
ISIC
This paper presents the principle and design of an SOI-CMOS low noise chopper amplifier for electronic data acquisition system in down-hole-drilling application that operates at the high temperature (>170 oC) regime. The chopper amplifier is designed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dbf9b77dba24209a0c47b3d72314532
https://doi.org/10.1109/isicir.2014.7029493
https://doi.org/10.1109/isicir.2014.7029493
Publikováno v:
SPIE Proceedings.
Conventional Coordinate Measuring Machines (CMMs) restrict the possibilities for measuring micro mechanical products and noncontact optical measuring methods are not suitable for true three-dimensional measurements. The integrated combination of opti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9395311df9093f5ec909aca0e0b2b838
https://doi.org/10.1117/12.819556
https://doi.org/10.1117/12.819556
Publikováno v:
Smart Devices and Machines for Advanced Manufacturing ISBN: 9781848001466
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b109142ab595f1618e21b0b81655e322
https://doi.org/10.1007/978-1-84800-147-3_13
https://doi.org/10.1007/978-1-84800-147-3_13
Publikováno v:
2007 7th IEEE Conference on Nanotechnology (IEEE NANO).
Conventional probes for dimensional measurement of parts in macro scale are no more capable for the meso- to micro-sized parts that require accuracy to the degree of 100 nm to 10 nm. This paper will discuss the needs of probe technologies for micro/n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0407e43d317f6ba87616a58c1c253db2
https://doi.org/10.1109/nano.2007.4601349
https://doi.org/10.1109/nano.2007.4601349