Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yau Kae Sheu"'
Autor:
Yen-Ting Chiang, Ming-Shing Chen, Joe Ko, Yau Kae Sheu, Wen Yi Liao, Chien-Ting Lin, Yean-Kuen Fang, Tung-Hsing Lee, Tsong Lin Shen
Publikováno v:
Japanese Journal of Applied Physics. 47:2624-2627
Negative bias temperature instability (NBTI) in a dual-gate-oxide complementary metal–oxide–semiconductor (CMOS) process induces threshold voltage (Vt) shift and has become a crucial challenge in designing advanced analog or mixed-signal circuits
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44c2f6c7f0afe22723e74cb962c6bf68
https://doi.org/10.1143/jjap.47.2624
https://doi.org/10.1143/jjap.47.2624
Autor:
James Yingbo Jia, Salim Sammie, Boon Keat Toh, Li Zhiguo, Fethi Dhaoui, Patty Liu, Pavan Singaraju, Zhao Bing Li, Jing Horng Gau, Yau Kae Sheu, Habtom Micael, Frank Hawley, Tzu-Yun Chang, Ren Chi
Publikováno v:
2012 IEEE International Integrated Reliability Workshop Final Report.
We present studies of an extrinsic program disturb mechanism in a Field Programmable Gate Array (FPGA) fabricated with a 65 nm embedded-Flash process. It is concluded that multiple positive charges are involved during disturb to explain the observed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74ef845cc677085ee8d13fa30c7b1f1b
https://doi.org/10.1109/iirw.2012.6468933
https://doi.org/10.1109/iirw.2012.6468933
Autor:
Joe Ko, Ming Shing Chen, Tung-Hsing Lee, Tsong Lin Shen, Yau Kae Sheu, Wen Yi Liao, Yean-Kuen Fang, Chin-Fu Lin
Publikováno v:
Extended Abstracts of the 2007 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aaddb5fcc870542d3c8e72b3255cd8ee
https://doi.org/10.7567/ssdm.2007.p-3-13
https://doi.org/10.7567/ssdm.2007.p-3-13