Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yating Ruan"'
Autor:
Oscar Recalde-Benitez, Tianshu Jiang, Robert Winkler, Yating Ruan, Alexander Zintler, Esmaeil Adabifiroozjaei, Alexey Arzumanov, William A. Hubbard, Tijn van Omme, Yevheniy Pivak, Hector H. Perez-Garza, B. C. Regan, Lambert Alff, Philipp Komissinskiy, Leopoldo Molina-Luna
Publikováno v:
Communications Engineering, Vol 2, Iss 1, Pp 1-8 (2023)
Abstract Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and inte
Externí odkaz:
https://doaj.org/article/67949337b138489992379497c532492b
Autor:
Yating Ruan, Stipo Matic, Patrick Salg, Dominik Walk, Zeinar Lukas, Philipp Komissinskiy, Rolf Jakoby, Lambert Alff
Publikováno v:
Oxide-based Materials and Devices XIV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1f52a1260e5dbfd594520484f2be7b3
https://doi.org/10.1117/12.2665973
https://doi.org/10.1117/12.2665973
Autor:
Oscar Recalde, Tianshu Jiang, Robert Eilhardt, Alexander Zintler, Yating Ruan, Alexey Arzumanov, Tijn van Omme, Gin Pivak, Hector H Perez-Garza, Philipp Komissinskiy, Lambert Alff, Leopoldo Molina-Luna
Publikováno v:
Microscopy and Microanalysis. 28:820-821
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d20bbd4cb806a07d0cb626ce246a135c
https://doi.org/10.1017/s1431927622003671
https://doi.org/10.1017/s1431927622003671