Zobrazeno 1 - 10
of 70
pro vyhledávání: '"Yasushi Azuma"'
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 71:1-9
Autor:
Yasushi, Azuma, Akira, Kurokawa
Publikováno v:
The Review of scientific instruments. 91(7)
In this study, a method to prevent surface contamination on an SiO
Autor:
Sho Okubo, Hajime Inaba, Naoki Kuramoto, Lulu Zhang, Kazuaki Fujita, Yasushi Azuma, Yuichi Ota, Shigeki Mizushima, Akira Kurokawa, Kenichi Fujii
Publikováno v:
2020 Conference on Precision Electromagnetic Measurements (CPEM).
The new definition of the kilogram based on the Planck constant was implemented in May 2019. The National Metrology Institute of Japan (NMIJ) will realize the new kilogram by the X-ray crystal density method using a 28Si-enriched sphere. An internati
Autor:
Hajime Inaba, Akira Kurokawa, Naoki Kuramoto, Kenichi Fujii, Kazuaki Fujita, Yasushi Azuma, Lulu Zhang, Shigeki Mizushima, Sho Okubo
Publikováno v:
Metrologia. 54:716-729
To determine the Avogadro constant N A by the x-ray crystal density method, the density of a 28Si-enriched crystal was determined by absolute measurements of the mass and volume of a 1 kg sphere manufactured from the crystal. The mass and volume were
Publikováno v:
Metrologia. 54:193-203
For the determination of the Avogadro constant by the x-ray crystal density method, an accurate volume measurement of 1 kg Si spheres is of primary importance. For this purpose, an optical interferometer was improved and used to measure the volumes o
Autor:
Graham C. Smith, Karen J. Gaskell, David Valley, Anne Fuchs, Takaharu Nagatomi, Jeffrey L. Fenton, Vincent Fernandez, Bin Cheng, David J. H. Cant, Marc Walker, Yusuke Yoshikawa, Yasushi Azuma, Fangyan Xie, Claudia L. Compean-Gonzalez, Hideyuki Yasufuku, Emmanuel Nolot, Li Yang, Makiho Eguchi, Jörg Radnik, Adam Bushell, Andrew G. Thomas, Akira Kurokawa, Wayne Lake, Andrzej Bernasik, Tahereh G. Avval, Lulu Zhang, Kateryna Artyushkova, Andreas Thissen, Naoyoshi Kubota, Jian Chen, Orlando Cortazar-Martínez, David J. Morgan, Matthew R. Linford, Bernd Bock, Emily F. Smith, Andrew J. Britton, Jonathan D. P. Counsell, Arthur P. Baddorf, Sven L. M. Schroeder, Alexander G. Shard, Gilad Zorn, Bill Theilacker, Abraham Jorge Carmona-Carmona, Giacomo Ceccone, Mariusz Hajdyła, Elizabeth A. Willneff, Riki Satoh, Mateusz M. Marzec, Benjamen P. Reed, Alberto Herrera-Gomez, Paul Dietrich, Steve J. Spencer, David G. Castner
Publikováno v:
Journal of Vacuum Science & Technology A. 39:027001
The lead authors failed to name two collaborators as co-authors. The authors listed should include: Miss Claudia L. Compean-Gonzalez (ORCID: 0000-0002-2367-8450) and Dr. Giacomo Ceccone (ORCID: 0000-0003-4637-0771). These co-authors participated in V
Autor:
Jailton Carreteiro Damasceno, J Mata-Salazar, Wolfgang E. S. Unger, C S Kim, C. A. Achete, Toshiyuki Fujimoto, Donald Windover, Michael Krumrey, Alexander G. Shard, A. S. Kim, Werner Jordaan, Akira Kurokawa, Lulu Zhang, H Ruh, Ludger Koenders, M. Wang, S W Song, Hai Wang, Braulio S. Archanjo, A Herrera-Gomez, Yasushi Azuma, Carlos Alberto Senna, Chris Jeynes, I. Busch, J M Juarez-Garcia, E Steel, O Cortazar-Martinez, Kyung Joong Kim, P E Hansen, J Radnik, Steve J. Spencer, Shinya Terauchi, J S Madesen
Publikováno v:
Metrologia. 58:08016
Main text A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in
Autor:
Akira Kurokawa, Yasushi Azuma, Akio Takano, Shinya Terauchi, Junichiro Sameshima, Toshiko Takatsuka, Seiichiro Mizuno, Tomohiro Narukawa
Publikováno v:
e-Journal of Surface Science and Nanotechnology. 14:125-130
Autor:
Akira Kurokawa, Yasushi Azuma
Publikováno v:
Review of Scientific Instruments. 91:075112
In this study, a method to prevent surface contamination on an SiO2 film/Si substrate system was used to improve thickness determination by x-ray reflectometry (XRR). XRR profiles can be significantly affected by the growth of a surface contamination
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. 64:1509-1513
To reduce the uncertainty of the Avogadro constant for the new definition of the kilogram, the surface analysis of the Si sphere produced for the accurate determination of the Avogadro constant is indispensable. In this paper, we conducted the surfac