Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Yasuhira Nagakubo"'
Autor:
Jiro Usukura, Akihiro Narita, Tomoharu Matsumoto, Eiji Usukura, Takeshi Sunaoshi, Syunya Watanabe, Yusuke Tamba, Yasuhira Nagakubo, Takashi Mizuo, Junzo Azuma, Masako Osumi, Kazutaka Nimura, Ryuichiro Tamochi, Yoichi Ose
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
Abstract The scanning electron microscope (SEM) has been reassembled into a new type of cryo-electron microscope (cryo-TSEM) by installing a new cryo-transfer holder and anti-contamination trap, which allowed simultaneous acquisition of both transmis
Externí odkaz:
https://doaj.org/article/b8e0ce76230b4113a0fa5d7ebebda2c7
Autor:
Akihiro Narita, Takeshi Sunaoshi, Yoichi Ose, Yusuke Tamba, Masako Osumi, Ryuichiro Tamochi, Junzo Azuma, Tomoharu Matsumoto, Yasuhira Nagakubo, Syunya Watanabe, Kazutaka Nimura, Jiro Usukura, Takashi Mizuo, Eiji Usukura
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
The scanning electron microscope (SEM) has been reassembled into a new type of cryo-electron microscope (cryo-TSEM) by installing a new cryo-transfer holder and anti-contamination trap, which allowed simultaneous acquisition of both transmission imag
Autor:
Masako Osumi, Tomoharu Matsumoto, Takashi Mizuo, Junzo Azuma, Takeshi Sunaoshi, Yasuhira Nagakubo, Ryuichiro Tamochi, Akihiro Narita, Syunya Watanabe, Kazutaka Nimura, Yoichi Ose, Eiji Usukura, Jiro Usukura, Yusuke Tamba
A new type of cryo-electron microscopy (cryo-S(T)EM) technique made possible by installing a new cryo-transfer holder and an anti-contamination trap on a scanning electron microscope (Hitachi SU9000) allowed simultaneous collection of both transmissi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef64fc2465a32bdc5e112b3165b32cc0
https://doi.org/10.21203/rs.3.rs-523739/v1
https://doi.org/10.21203/rs.3.rs-523739/v1
Autor:
Xiao Feng Zhang, Isao Nagaoki, Nobuhiro Saito, Yoshifumi Taniguchi, Hiroaki Matsumoto, Shigeto Isakozawa, Norio Baba, Akira Watabe, Yasuhira Nagakubo
Publikováno v:
Microscopy. 65:353-362
A new in situ environmental transmission electron microscope (ETEM) was developed based on a 300 kV TEM with a cold field emission gun (CFEG). Particular caution was taken in the ETEM design to assure uncompromised imaging and analytical performance
Autor:
Y. Suzuki, Mizuno Takayuki, Yasuhira Nagakubo, C.T. Schamp, K. Ito, Junichi Fuse, Akira Kageyama, Hiroyuki Tanaka
Publikováno v:
International Symposium for Testing and Failure Analysis.
In transmission electron microscopy (TEM), one typically considers bright-field or dark-field imaging signals, which utilize the transmitted and scattered electrons, respectively. Analytical signals such as characteristic X-Rays or primary electron b
Autor:
Kuniyasu Nakamura, Akira Kageyama, Mizuno Takayuki, Hiroaki Matsumoto, Yasuhira Nagakubo, Yuya Suzuki, Hiroyuki Tanaka
Publikováno v:
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
To realize higher spatial resolution than conventional SEM-based nano-probing system, a novel Electron Beam Absorbed Current imaging system was newly developed using a Hitachi HD-2700 200 kV dedicated STEM. Its specimen holder accommodates a mechanic
Autor:
Masako Osumi, Junzo Azuma, Akihiro Narita, Yusuke Tamba, Tomoharu Matsumoto, Eiji Usukura, Takeshi Sunaoshi, Jiro Usukura, Yoichi Ose, Yasuhira Nagakubo, Ryuichiro Tamochi
Publikováno v:
Microscopy and Microanalysis. 24:1158-1159
Publikováno v:
Journal of Electron Microscopy. 60:217-225
An environmental cell for high-temperature, high-resolution transmission electron microscopy of nanomaterials in near atmospheric pressures is developed. The developed environmental cell is a side-entry type with built-in specimen-heating element and
Autor:
Takeo Kamino, Hiroaki Matsumoto, Akira Watabe, Yasuhira Nagakubo, Toshie Yaguchi, Hiroshi Kakibayashi
Publikováno v:
Journal of the Vacuum Society of Japan. 54:280-284
Autor:
Yasuhira Nagakubo, Ryuichiro Tamochi, Akihiro Narita, Tomoharu Matsumoto, Yoichi Ose, Masako Osumi, Junzo Azuma, Takeshi Sunaoshi, Jiro Usukura, Eiji Usukura, Yusuke Tamba
Publikováno v:
Microscopy. 66:i6-i6