Characterization and application of multilayer diffraction gratings as optochemical sensors

Autor: Dmitruk, N.L ^*, Mayeva, O.I, Mamykin, S.V, Yastrubchak, O.B, Klopfleisch, M

Publikováno v: In Sensors & Actuators: A. Physical 2001 88(1):52-57

Analysis of the Electronic and Band-Structure in As-grown and Annealed (Ga,Mn)As Epitaxial Layers

Autor: Yastrubchak, O.B., Zuk, J., Sadowski, J., Domagala, J.Z., Wosinski, T.

The photoreflectance (PR) spectroscopy was applied to study the band-structure evolution in (Ga,Mn)As layers with increasing Mn content. We investigated (Ga,Mn)As layers and, as a reference, undoped GaAs layer, grown by LT-MBE on semi-insulating (001

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______2001::b84b14ee594c1608059c469416b9c2df
http://essuir.sumdu.edu.ua/handle/123456789/34993

On a control of photon-surface plasmon coupling at a multilayer diffraction grating.

Autor: Dmitruk, N.L., Mayeva, O.I., Mamykin, S.V., Yastrubchak, O.B.

Publikováno v: ASDAM 2000. Conference Proceedings Third International EuroConference on Advanced Semiconductor Devices & Microsystems (Cat. No.00EX386); 2000, p445-448, 4p

Multilayer Diffraction Gratings Al/GaAs as Polaritonic Photodetectors

Autor: Dmitruk, N.L., Klopfleisch, M., Mayeva, O.I., Mamykin, S.V., Venger, E.F., Yastrubchak, O.B.

Publikováno v: Physica Status Solidi (A) - Applications and Materials Science; March 2001, Vol. 184 Issue: 1 p165-174, 10p

Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.