Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Yao-Kai Shih"'
Autor:
Yu-Zhe Zheng, Terry Tai-Jui Wang, Po-Hsun Chen, Yu-Ching Tsao, Hong-Chih Chen, Ann-Kuo Chu, Wei-Han Chen, Shin-Ping Huang, Yu-Xuan Wang, Yu-Hua Chung, Chia-Chuan Wu, Shengdong Zhang, Yu-Shan Shih, Yao-Kai Shih, Ting-Chang Chang
Publikováno v:
IEEE Transactions on Electron Devices. 66:4764-4767
We investigate the abnormal current-voltage (C-V) hump effect of p-type low-temperature polysilicon (LTPS) thin-film transistors (TFTs) which have undergone high current operations. Experimental results indicate localized electron trapping in the gat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3459b7728d95a3722fb7fe5b6c1be09e
https://doi.org/10.1109/ted.2019.2942149
https://doi.org/10.1109/ted.2019.2942149
Autor:
Wei-Chen Huang, Lin-Yi Shih, Hui-Chun Huang, Wen-Chung Chen, Yi-Ting Tseng, Ting-Chang Chang, Tsung-Ming Tsai, Simon M. Sze, Chih-Cheng Shih, Chih-Cheng Yang, Pei-Yu Wu, Yao-Kai Shih, Hao-Xuan Zheng
Publikováno v:
physica status solidi (RRL) – Rapid Research Letters. 13:1900285
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97fef15c06a80997fabc1c0774463e70
https://doi.org/10.1002/pssr.201900285
https://doi.org/10.1002/pssr.201900285