Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Yanzhou Mu"'
Publikováno v:
IEEE Access, Vol 8, Pp 30037-30049 (2020)
Cross-project defect prediction (CPDP) methods can be used when the target project is a new project or lacks enough labeled program modules. In these new target projects, we can easily extract and then measure these modules with software measurement
Externí odkaz:
https://doaj.org/article/daf4e6479e844feb9d60790b2cefd08b
Publikováno v:
IEEE Access, Vol 7, Pp 184832-184848 (2019)
Cross-project defect prediction (CPDP) is an active research topic in the domain of software defect prediction, since CPDP can be applied to the following scenarios: the target project for software defect prediction is a new project or the target pro
Externí odkaz:
https://doaj.org/article/e64afea490864d4bbf8682dc9b572c00
Publikováno v:
2021 IEEE 21st International Conference on Software Quality, Reliability and Security (QRS).
Publikováno v:
Information and Software Technology. 150:106982
Publikováno v:
International Journal of Software & Informatics; 2022, Vol. 12 Issue 4, p403-436, 34p
Publikováno v:
IJCNN
Cross-project defect prediction (CPDP) as a means to focus quality assurance of software projects was under heavy investigation in recent years. In this paper, we propose a novel CPDP approach via deep learning. In particular, we model each program m