Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Yannick Vercammen"'
Autor:
Matthias Van Zele, Jonathan Watté, Jan Hasselmeyer, Hannes Rijckaert, Yannick Vercammen, Steven Verstuyft, Davy Deduytsche, Damien P. Debecker, Claude Poleunis, Isabel Van Driessche, Klaartje De Buysser
Publikováno v:
Materials, Vol 11, Iss 7, p 1101 (2018)
The thickness characterization of transparent protective coatings on functional, transparent materials is often problematic. In this paper, a toolbox to determine the thicknesses of a transparent coating on functional window films is presented. The t
Externí odkaz:
https://doaj.org/article/8fb33b55a1b44a01a6eaed36d368b40a
Excimer laser patterning of PEDOT:PSS thin-films on flexible barrier foils: A surface analysis study
Autor:
Rajesh Mandamparambil, Luc Van Vaeck, David Schaubroeck, Sanjeev Naithani, Iryna Yakimets, Geert Van Steenberge, Yannick Vercammen
Publikováno v:
Applied surface science
Selective laser patterning of thin organic films is an important aspect in the roll-to-roll production of organic electronic devices such as organic light emitting diodes (OLEDs). An excimer laser is well suited for the patterning and structuring of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56262b5314d2bab1e5b3cab1cbb80d56
https://doi.org/10.1016/j.apsusc.2013.05.018
https://doi.org/10.1016/j.apsusc.2013.05.018
Publikováno v:
Surface and interface analysis
Polyatomic projectiles such as C 60 + have been used for molecular sputter depth profiling in time-of-flight static secondary ion mass spectrometry iToF-S-SIMS). However, the practical application for nanoscale analysis problems still depends on the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd8784fd69901e39f25c1800d8559d00
https://doi.org/10.1002/sia.3593
https://doi.org/10.1002/sia.3593
Publikováno v:
Applied Surface Science, 284, 354-365. Elsevier Science
Applied surface science
Applied surface science
Time-of-Flight Static Secondary Ion Mass Spectrometry excels in probing the molecular composition of the outer monolayer of flat samples with a lateral resolution in the sub-mu m range. However, the method faces significant methodological problems in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0688bdb10208eb7a51ff59f348984a88
https://cris.maastrichtuniversity.nl/en/publications/6a00cdb6-7ee4-4d29-8867-cdec119c9597
https://cris.maastrichtuniversity.nl/en/publications/6a00cdb6-7ee4-4d29-8867-cdec119c9597
Autor:
Jaymes Van Luppen, Yannick Vercammen, F. Vangaever, Christiaan Van Roost, Luc Van Vaeck, Roel De Mondt
Publikováno v:
Analytical and bioanalytical chemistry
Molecular depth profiling is needed to develop high-tech materials optimised to the μm or even up to the nm scale. Recent progress in time-of-flight static secondary ion mass spectrometry (ToF-S-SIMS) offers perspectives to molecular depth profiling
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4946d818ac7315a5dafb6de146b0df08
https://hdl.handle.net/10067/1074890151162165141
https://hdl.handle.net/10067/1074890151162165141
Publikováno v:
Analytical and bioanalytical chemistry
Development of sustainable materials requires methods capable of probing the molecular composition of samples not only at the surface but also in depth. Static secondary ion mass spectrometry (S-SIMS) characterises the distribution of organic and ino
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d44a4aea1e3fc3936a5a6d822615af11
https://pubmed.ncbi.nlm.nih.gov/20213176
https://pubmed.ncbi.nlm.nih.gov/20213176