Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Yannick Bonhomme"'
Autor:
Wafa Ben Hassen, Antoine Dupret, Romain Gabet, Freddy Morel, Yannick Bonhomme, Fabrice Auzanneau, Ludovic Solange, Luca Incarbone, Samuel Evain, Armando Zanchetta
Publikováno v:
2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA)
2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA), Jun 2015, Auckland, New Zealand. pp.1761-1765, ⟨10.1109/ICIEA.2015.7334396⟩
2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA), Jun 2015, Auckland, New Zealand. pp.1761-1765, ⟨10.1109/ICIEA.2015.7334396⟩
Conference of 10th IEEE Conference on Industrial Electronics and Applications, ICIEA 2015 ; Conference Date: 15 June 2015 Through 17 June 2015; Conference Code:118313; International audience; This paper presents the first embedded health monitoring s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::67f656df1f7884f372c14676e7fd142b
https://hal-cea.archives-ouvertes.fr/cea-01839852
https://hal-cea.archives-ouvertes.fr/cea-01839852
Autor:
Yannick Bonhomme, Patrick Girard
Publikováno v:
Journal of Low Power Electronics
Journal of Low Power Electronics, American Scientific Publishers, 2005, 1 (1), pp.85-95
HAL
Journal of Low Power Electronics, American Scientific Publishers, 2005, 1 (1), pp.85-95
HAL
International audience
Publikováno v:
2014 IEEE SENSORS
2014 IEEE SENSORS, Nov 2014, Valencia, Spain. pp.562-565, ⟨10.1109/ICSENS.2014.6985060⟩
2014 IEEE SENSORS, Nov 2014, Valencia, Spain. pp.562-565, ⟨10.1109/ICSENS.2014.6985060⟩
Conference of 13th IEEE SENSORS Conference, SENSORS 2014 ; Conference Date: 2 November 2014 Through 5 November 2014; Conference Code:112210; International audience; This paper presents an EMC (Electromagnetic Compatibility) compliant sensor able to d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ca36f2027551c7cc29693ae6045cc00
https://cea.hal.science/cea-01817870
https://cea.hal.science/cea-01817870
Publikováno v:
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2013, 29, pp.601-608. ⟨10.1007/s10836-013-5396-6⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.601-608. ⟨10.1007/s10836-013-5396-6⟩
Journal of Electronic Testing, Springer Verlag, 2013, 29, pp.601-608. ⟨10.1007/s10836-013-5396-6⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.601-608. ⟨10.1007/s10836-013-5396-6⟩
International audience; Error-correcting codes (ECC) offer an efficient way to improve the reliability and yield of memory subsystems. ECC-based protection is usually provided on a memory word basis such that the number of data-bits in a codeword cor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c4d57f7fb9895278f324edef7d40b3ea
https://hal-cea.archives-ouvertes.fr/cea-01777396
https://hal-cea.archives-ouvertes.fr/cea-01777396
Publikováno v:
European Test Symposium
Error-correcting codes (ECC) offer an efficient way to improve the reliability and yield of memory subsystems. ECC-based protection is usually provided on a memory word basis such that the number of data-bits in a codeword corresponds to the amount o
Publikováno v:
IOLTS
IOLTS 2011-2011 IEEE 17th International
Testing Symposium
Testing Symposium, Jul 2011, Athens, Greece. pp.198-201, ⟨10.1109/IOLTS.2011.5993842⟩
IOLTS 2011-2011 IEEE 17th International
Testing Symposium
Testing Symposium, Jul 2011, Athens, Greece. pp.198-201, ⟨10.1109/IOLTS.2011.5993842⟩
International audience; Hsiao and extended Hamming parity-check matrices can be used to define systematic linear block codes for Single Error Correction-Double Error Detection (SEC-DED). Their fixed code word parity enables the construction of low de
Publikováno v:
VTS
Redundant memory columns are an essential ingredient of memory design for yield and reliability. They are used either as spare columns for the replacement of completely defective regular columns or to store check-bits for error detection and correcti
Publikováno v:
IOLTS
With increasing storage capacities, spare memory columns aimed at replacing defective regular columns remain generally available to repair malfunctioning storage cells. The existing repair methods are based on column replacement. Consequently, the nu
Publikováno v:
SimuTools
This paper focuses on the simulation of heterogeneous systems, in terms of hardware and software, that contain thousands of various Embedded Control Units (ECUs) which communicate with each other throughout a network. Designers need to simulate ECU i
Publikováno v:
IFIP – The International Federation for Information Processing ISBN: 9780387094403
WSAN
WSAN
Power savings are nowadays crucial in embedded system contexts such as Wireless Sensor Networks (WSN) in order to increase the lifetime of sensor nodes. In this paper, we propose a new hardware structure called “Power-On Controller” (POC) for app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ea90a56a912d2f517d7676dd15ff831
https://doi.org/10.1007/978-0-387-09441-0_5
https://doi.org/10.1007/978-0-387-09441-0_5