Zobrazeno 1 - 6
of 6
pro vyhledávání: '"YangJing Shi"'
Publikováno v:
Measurement + Control, Vol 53 (2020)
When low-resolution face images are used for face recognition, the model accuracy is substantially decreased. How to recover high-resolution face features from low-resolution images precisely and efficiently is an essential subtask in face recognitio
Externí odkaz:
https://doaj.org/article/f38f6c40b167451daa28ef114fc0944a
Publikováno v:
Sensors, Vol 20, Iss 16, p 4601 (2020)
Currently, various agricultural image classification tasks are carried out on high-resolution images. However, in some cases, we cannot get enough high-resolution images for classification, which significantly affects classification performance. In t
Externí odkaz:
https://doaj.org/article/cff736d8fe244502852cc1b082f48cb4
Autor:
Jin Huang, Yan Feng, YangJing Shi, Weilin Shao, Genshan Li, Gangxian Chen, Ying Li, Zuozhang Yang, Zhihong Yao
Publikováno v:
International Journal of Medical Sciences; 2024, Vol. 21 Issue 11, p2065-2080, 16p
Publikováno v:
Chinese Journal of Sociology. 8:243-267
Based on the 2014 China Labor-force Dynamics Survey data, this paper constructs a population diversity index to test the impact of population diversity on crime rates. The results suggest that population diversity is one of the causes of increasing u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c042d780542c94e3e08e9f1d5b8e2b8
https://doi.org/10.1177/2057150x221091078
https://doi.org/10.1177/2057150x221091078
Publikováno v:
Measurement + Control, Vol 53 (2020)
When low-resolution face images are used for face recognition, the model accuracy is substantially decreased. How to recover high-resolution face features from low-resolution images precisely and efficiently is an essential subtask in face recognitio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::04f9422fc186c6b05a3a9d3cdf3e5a59
https://doi.org/10.1177/0020294020944969
https://doi.org/10.1177/0020294020944969
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9789811669620
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87f9eb90dd46dad1059dd38ea3310c7a
https://doi.org/10.1007/978-981-16-6963-7_9
https://doi.org/10.1007/978-981-16-6963-7_9
