Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Yan Eliovich"'
Autor:
Alexander Machikhin, Dmitry Chernov, Demid Khokhlov, Artem Marchenkov, Alexey Bykov, Yan Eliovich, Ivan Petrov, Timofey Balandin, Alexander Kren, Ilya Sergeev, Yuri Pisarevsky
Publikováno v:
Materials, Vol 17, Iss 14, p 3590 (2024)
Monitoring the processes inside crystalline materials under their operating conditions is of great interest in optoelectronics and scientific instrumentation. Early defect detection ensures the proper functioning of multiple crystal-based devices. In
Externí odkaz:
https://doaj.org/article/85c510fab4ef4f3495f2c3d5bb94f85e
Autor:
Valentin Akkuratov, Alexander Blagov, Yan Eliovich, Anton Targonskii, Yuri Pisarevsky, Andrei Protsenko, Vladimir Shishkov, Mikhail Kovalchuk
Publikováno v:
Journal of Applied Crystallography. 55:80-89
A novel laboratory diffractometer for time-resolved high-resolution X-ray diffraction studies of reversible and irreversible processes in crystalline materials under uniaxial compression and vibration is described. Temporal resolution up to milliseco
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17918affec9bbcaee3e3fcfcb8ad68bc
https://doi.org/10.1107/s160057672101236x
https://doi.org/10.1107/s160057672101236x
Autor:
Yuri Pisarevsky, Andrei Protsenko, P. A. Prosekov, A. E. Blagov, Anton V. Targonskiy, Yan Eliovich, M. V. Kovalchuk, Valentin Akkuratov
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 73:C1419-C1419
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71edfaf28da0e428dc67346328a01b88
https://doi.org/10.1107/s2053273317081578
https://doi.org/10.1107/s2053273317081578