Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Ya. L. Shabel'nikova"'
Publikováno v:
Semiconductors. 54:1854-1857
The feature of the promising tool of lithographic nanostructuring based on selective exposure of polymer resist by ion beam is very compact (of about tens of nanometers) beam interaction volume. Herewith the main part of beam energy is deposited in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16e807735fc032f80ae9f8eb62358629
https://doi.org/10.1134/s1063782620140262
https://doi.org/10.1134/s1063782620140262
Autor:
Marina Chukalina, Yu. S. Krivonosov, Ya. L. Shabel’nikova, D. A. Ivanov, Anastasia Ingacheva, Dmitry P. Nikolaev, Alexey Buzmakov
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14:978-990
In this study we present an approach used to truncate the empty space outside ROI on a stack of 2D tomographic projections by the means of locating the specific region of interest (ROI). In this work we shall consider the following definition of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e8facc49fffe1902720166c70a1527c
https://doi.org/10.1134/s1027451020050079
https://doi.org/10.1134/s1027451020050079
Publikováno v:
Instruments and Experimental Techniques. 63:425-429
The use of a special device that limits the field of view of a detector, i.e., a confocal collimator, is one of the approaches to obtaining information about the spatial distribution of the detected material in the methods for radionuclide diagnostic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::35fbd50d753a81d8fe087daa39ba08ff
https://doi.org/10.1134/s0020441220030203
https://doi.org/10.1134/s0020441220030203
Autor:
Ya. L. Shabel’nikova, S. I. Zaitsev, High-Purity Materials Ras, Chernogolovka, Russia, M. Myrzabekova, N. Guseinov, S.R. Muradova, M.M. Muratov, T.B. Turarbaeva
Publikováno v:
Recent Contributions to Physics. 68:81-90
The paper considers one of the methods of micro - and nano - images formation with high accuracy of process control – electronic lithography. Comparing to other nanostructuring technologies, such as photolithography in particular, electronic lithog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0046b2c8d1125a29adffac959e3734a0
https://doi.org/10.26577/rcph-2019-1-1112
https://doi.org/10.26577/rcph-2019-1-1112
Publikováno v:
Semiconductors. 49:741-745
A solar cell on a wafer of multicrystalline silicon containing grain boundaries was studied by the induced-current method. The sample was scanned by an electron beam and by a laser beam at two wavelengths (980 and 635 nm). The recorded induced-curren
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f092ffb85bb3b43899f6fe3d58641e8
https://doi.org/10.1134/s1063782615060226
https://doi.org/10.1134/s1063782615060226
Autor:
R. Nemkayeva, Ya. L. Shabel’nikova, D. V. Ismailov, N. Guseinov, S. I. Zaitsev, M. Myrzabekova, High-Purity Materials Ras, Chernogolovka, Russia, M.M. Muratov
Publikováno v:
Journal of Nano- and Electronic Physics. 12:04038-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b3086512eaa04689b7e1ca111deb0a5
https://doi.org/10.21272/jnep.12(4).04038
https://doi.org/10.21272/jnep.12(4).04038
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 7:859-862
A model of the interaction between an X-ray beam and a semiconductor sample is proposed for the X-ray-beam induced current method. The spatial distribution of the generation rate of nonequilibrium charge carriers (also called the generation function)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2df4b6f0c9d4a8b34a3300e35246094
https://doi.org/10.1134/s1027451013050145
https://doi.org/10.1134/s1027451013050145
Publikováno v:
Technical Physics Letters. 38:913-916
The contrast of extended defects representing dislocations and grain boundaries has been calculated for the X-ray-beam-induced current (XBIC) method. It is established that the maximum contrast increases with the diffusion length of excess charge and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6210bb554ee436ffec410550a1c460fe
https://doi.org/10.1134/s1063785012100239
https://doi.org/10.1134/s1063785012100239
Autor:
M. V. Chukalina, Ya. L. Shabel’nikova
Publikováno v:
Technical Physics Letters. 38:452-455
The response signal collection functions in a confocal setup of the X-ray fluorescence (XRF) tomography have been modeled for a polycapillary collimator and a multichannel collimator fabricated by means of microelectronic technology (MT). The dimensi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7315d2ed9df6c48c0b6c0572b8629f2b
https://doi.org/10.1134/s1063785012050288
https://doi.org/10.1134/s1063785012050288
Autor:
V. V. Aristov, A. V. Buzmakov, M. M. Novikov, Alexander V. Evseev, V. Ya. Panchenko, V. E. Asadchikov, T. A. Sagdullin, Ya. L. Shabel’nikova, L. G. Shabel’nikov
Publikováno v:
Doklady Physics. 54:273-276
Refractive X-ray optics, the physical fundamentals of which were considered by us previously [1], is presented mainly by focusing devices. Among them, an important role is played by compound lenses, the constructions of which are based on the additiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4e4652ecbe645b7fa02b029bad7cdb5
https://doi.org/10.1134/s1028335809060056
https://doi.org/10.1134/s1028335809060056