Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Ya Ting Shyu"'
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29:1652-1664
High temperature or temperature nonuniformity has become a serious threat to performance and reliability of high-performance integrated circuits (ICs). Since the temperature in a 3-D IC is mainly determined by a power distribution across tiers, this
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29:985-997
High temperature or temperature nonuniformity has become a serious threat to performance and reliability of high-performance integrated circuits (ICs), which makes the thermal effect turn into a nonignorable issue in the circuit design or the physica
Autor:
Huan-Jui Hu, Li-Jen Chang, Chun-Po Huang, Hwa-An Tseng, Chih-Huei Hou, Ya-Ting Shyu, Chung-Wei Hsu, Chih-Yuan Kung, Soon-Jyh Chang
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 65:881-890
This paper presents a new circuit technique named residue oversampling, which is suitable for high-resolution analog-to-digital converters (ADCs). By adopting this technique and simplifying the dynamic element matching, the impacts of capacitor misma
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:1730-1743
As technology advances, power consumption becomes a big challenge in modern very large-scale integration designs. To resolve this problem, power-gated technology has been widely adopted in circuit designs. Since the turn-on sequence of power switches
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:1835-1848
Successive approximation register (SAR) analog-to-digital converters (ADCs) are widely used in biomedical and portable/wearable electronic systems due to their excellent power efficiency. However, both the design and the optimization of high-performa
Autor:
Jai-Ming Lin, Tai-Ting Chen, Wei-Yi Chang, Juin-Ming Lu, Yeong-Jar Chang, Ya-Ting Shyu, Yen-Fu Chang
Publikováno v:
ICCAD
High temperature or temperature non-uniformity have become a serious threat to performance and reliability of high-performance integrated circuits (ICs). Thermal effect becomes a non-ignorable issue to circuit design or physical design. To estimate t
Publikováno v:
IEEE Sensors Journal. 14:2633-2642
A primary-auxiliary temperature sensing scheme for system-on-a-chip application is proposed in this paper. Taking advantage of the high accuracy and linearity of the analog primary temperature sensors and low production cost of the digital auxiliary
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 21:624-635
Power has become a burning issue in modern VLSI design. In modern integrated circuits, the power consumed by clocking gradually takes a dominant part. Given a design, we can reduce its power consumption by replacing some flip-flops with fewer multi-b
Publikováno v:
IEEE Transactions on Circuits and Systems I: Regular Papers. 60:570-581
This paper presents a 9-bit subrange analog-to-digital converter (ADC) consisting of a 3.5-bit flash coarse ADC, a 6-bit successive-approximation-register (SAR) fine ADC, and a differential segmented capacitive digital-to-analog converter (DAC). The
Publikováno v:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. :2415-2423
SUMMARY Real-time on-chip measurement of bit error rate (BER) for high-speed analog-to-digital converters (ADCs) does not only require expensive multi-port high-speed data acquisition equipment but also enormous post-processing. This paper proposes a