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pro vyhledávání: '"Y.L Leow"'
Autor:
N. Daval, A. Drouin, H. Biard, L. Viravaux, D. Radisson, S. Rouchier, G. Gaudin, J. Widiez, F. Allibert, E. Rolland, K. Vladimirova, G. Gelineau, N. Troutot, C. Navone, G. Berre, D. Bosch, Y.L Leow, A. Duboust, J-M. Bethoux, R. Boulet, A. Chapelle, E. Cela, G. Lavaitte, A. Bouville-Lallart, S. Bhargava, W. Schwarzenbach, C. Maddalon, I. Radu, S. Odoul, D. Delprat, O. Bonnin, C. Maleville
Publikováno v:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a5b3e25b6304080f27f5d269907d44f
https://doi.org/10.1109/edtm53872.2022.9798032
https://doi.org/10.1109/edtm53872.2022.9798032
