Zobrazeno 1 - 10
of 61
pro vyhledávání: '"Y. Tadaki"'
Autor:
Seisuke Matsuda, Shunsuke Suzuki, Toru Kondo, Mitsuhiro Tsukimura, Kenji Kobayashi, J. Aoki, Yoshiaki Takemoto, Yuichi Gomi, Y. Tadaki, Haruhisa Saito, H. Kato, Naohiro Takazawa
Publikováno v:
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b330cc6373759172223ebfdccdb7555
https://doi.org/10.7567/ssdm.2015.e-4-3
https://doi.org/10.7567/ssdm.2015.e-4-3
Autor:
S. Yamamoto, T. Kisu, Y. Tadaki, Satoru Yamada, Misuzu Kanai, R. Furukawa, M. Morino, T. Kawagoe, Yoshitaka Nakamura, K. Kawakita, T. Uemura, Isamu Asano, T. Tamaru, T. Sekiguchi, H. Kawamura, Y. Sugawara, M. Nakamura, Jun Kuroda, Masato Kunitomo, Shinpei Iijima, M. Nakata, Yuzuru Ohji
Publikováno v:
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).
A 1.5 nm equivalent thickness Ta/sub 2/O/sub 5//rugged Si capacitor is demonstrated for mass production of high density DRAMs (Dynamic Random Access Memories). More than 10 years breakdown lifetime of CVD-TiN/Ta/sub 2/O/sub 5//rugged Si capacitor is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91cfab68186bfc71619212874e88836a
https://doi.org/10.1109/iedm.1998.746466
https://doi.org/10.1109/iedm.1998.746466
Autor:
M. Hasegawa, M. Nakamura, S. Nanri, S. Ohkuma, Y. Kawase, H. Endoh, S. Miyatake, T. Akiba, K. Kawakita, M. Yoshida, S. Yamada, T. Sekiguchi, S. Asano, Y. Tadaki, R. Nagai, S. Miyaoka, K. Kajigaya, M. Horiguchi, Y. Nakagome
Publikováno v:
1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156).
A 204.9 mm/sup 2/ 256 Mb SDRAM has a 29 ns RAS access time and a 1ns clock access time. The SDRAM enables double-data-rate (DDR) at more than 300 Mb/s/pin, and features low-Vth and high-drivability MOSFETs combined with subthreshold leakage current s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d553fa86eb92fb9dbd7296d7cc3ef535
https://doi.org/10.1109/isscc.1998.672384
https://doi.org/10.1109/isscc.1998.672384
Autor:
Isamu Asano, H. Enomoto, M. Yoshida, T. Kumauchi, T. Umezawa, Y. Tadaki, N. Ohashi, N. Yamamoto, K. Kawakita
Publikováno v:
International Electron Devices Meeting. IEDM Technical Digest.
An advanced memory cell structure with poly/metal word lines and metal bit lines is proposed. The thermal processes are carefully designed for the metal-based cell to be consistent with narrow gap filling, wet cleaning, planarity, and the contact pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f7ab9ed1ca2707bf864d6bd66f9e641
https://doi.org/10.1109/iedm.1997.649451
https://doi.org/10.1109/iedm.1997.649451
Autor:
M. Nakamura, T. Takahashi, T. Akiba, G. Kitsukawa, M. Morino, T. Sekiguchi, I. Asano, K. Komatsuzaki, Y. Tadaki, C. Songsu, K. Kajigaya, T. Tachibana, K. Satoh
Publikováno v:
Proceedings ISSCC '95 - International Solid-State Circuits Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7074a12b631fe5043d9bfa0217c76e74
https://doi.org/10.1109/isscc.1995.535541
https://doi.org/10.1109/isscc.1995.535541
Autor:
T. Takahashi, T. Sekiguchi, R. Takemura, S. Narui, H. Fujisawa, S. Miyatake, M. Morino, K. Arai, S. Yamada, S. Shukuri, M. Nakamura, Y. Tadaki, K. Kajigaya, K. Kimura, K. Itoh
Publikováno v:
2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::817b0b7028642169e66ffb3118b571c6
https://doi.org/10.1109/isscc.2001.912682
https://doi.org/10.1109/isscc.2001.912682
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Akademický článek
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Publikováno v:
ResearcherID
The size structure of trees in crowded, even-aged Abies (fir) stands of «Shimagare» or «wave-regenerated» sub-alpine forests is analyzed. Tree-height distributions show consistently smaller variation and less positive skewness than the distributi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d6a54b794b61d58bf24c6547dda4307
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1990DD88600014&KeyUID=WOS:A1990DD88600014
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:A1990DD88600014&KeyUID=WOS:A1990DD88600014
