Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Y. S. M. Alvin"'
Publikováno v:
Materials Research Innovations. 18:S6-375
In this work, properties of aluminium nitride films grown on Si substrates with two different thicknesses were investigated. From our observations, the aluminium nitride film with the thickness of ∼122 nm exhibited a better characteristic than the
Publikováno v:
Materials Research Express. 6:066403
This work describes crystal and surface properties of a ScN interlayer, which was deposited on GaAs substrate with successive ammonia annealing at different temperature; 700 °C, 800 °C, 850 °C and 900 °C. The crystal and surface of the ScN interl
Publikováno v:
Materials Research Express; 6/6/2019, Vol. 6 Issue 6, p1-1, 1p