Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Y. S. M. Alvin"'
Publikováno v:
Materials Research Innovations. 18:S6-375
In this work, properties of aluminium nitride films grown on Si substrates with two different thicknesses were investigated. From our observations, the aluminium nitride film with the thickness of ∼122 nm exhibited a better characteristic than the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09bc1ae681113886fd0cfc8933918f75
https://doi.org/10.1179/1432891714z.0000000001011
https://doi.org/10.1179/1432891714z.0000000001011
Publikováno v:
Materials Research Express. 6:066403
This work describes crystal and surface properties of a ScN interlayer, which was deposited on GaAs substrate with successive ammonia annealing at different temperature; 700 °C, 800 °C, 850 °C and 900 °C. The crystal and surface of the ScN interl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e6c2e13e7a5a54ef690e7ce57c10a1a
https://doi.org/10.1088/2053-1591/ab0a8b
https://doi.org/10.1088/2053-1591/ab0a8b
Publikováno v:
Materials Research Express; 6/6/2019, Vol. 6 Issue 6, p1-1, 1p
Publikováno v:
Journal of Electronic Materials; Jun2019, Vol. 48 Issue 6, p3547-3553, 7p, 1 Color Photograph, 2 Black and White Photographs, 1 Diagram, 4 Charts, 5 Graphs
Publikováno v:
Materials Research Innovations; Dec2014 Supplement, Vol. 18, pS6-375-S6-377, 3p