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pro vyhledávání: '"Y. M. Kapoor"'
Autor:
Paul W. Schmidt, Y. M. Kapoor, Peter Pfeifer, Thomas P. Rieker, Daniel J. Voss, Françoise Ehrburger-Dolle
Publikováno v:
MRS Proceedings. 407
Small-angle x-ray scattering has been used to investigate the structure of some carbon blacks, some silicas, and an alumina-silica catalyst carrier on length scales from about 5 to 10,000 Å. Equations developed for structural studies of fractal and
Autor:
Y. M. Kapoor, E. B. Hensley
Publikováno v:
Physical Review B. 23:5581-5589