Zobrazeno 1 - 1
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pro vyhledávání: '"Y. E. Bich"'
Publikováno v:
Journal of Applied Spectroscopy. 88:535-538
Substructures of LiF crystal samples grown by the Kyropoulos and Bridgman–Stockbarger methods were studied. Measurements were made using the double-crystal x-ray diffractometry technique. The angular full width at half maximum (FWHM) of peaks was c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::740e13b8fa9783937db1ffcd9830e15f
https://doi.org/10.1007/s10812-021-01205-4
https://doi.org/10.1007/s10812-021-01205-4
