Zobrazeno 1 - 10
of 896
pro vyhledávání: '"Y. Dieter"'
Autor:
Javier Andreu-Pintado
Publikováno v:
Memoria y Civilización, Vol 22, Pp 825-828 (2019)
Externí odkaz:
https://doaj.org/article/9433cdf89e534316a997c9caaf3c196d
Publikováno v:
Areté. 16(1):163-175
Externí odkaz:
http://repositorio.pucp.edu.pe/index/handle/123456789/112861
http://revistas.pucp.edu.pe/index.php/arete/article/view/551/541
http://revistas.pucp.edu.pe/index.php/arete/article/view/551/541
Autor:
Rosemary Rizo-Patrón
Publikováno v:
Areté, Vol 16, Iss 1 (2004)
La reseña no presenta resumen.
Externí odkaz:
https://doaj.org/article/e207cc0592854e8a9b01cb3f95b78d3d
Autor:
Josep Ignasi Saranyana
Publikováno v:
Scripta Theologica. 20:387
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8ea9282afdf852b89fa1fc75d013fa5
https://doi.org/10.15581/006.20.19430
https://doi.org/10.15581/006.20.19430
Autor:
Barrios Casares, Manuel
Publikováno v:
idUS. Depósito de Investigación de la Universidad de Sevilla
instname
instname
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4a863cd05330acd54b03d21342b49f07
https://idus.us.es/xmlui/handle/11441/61613
https://idus.us.es/xmlui/handle/11441/61613
Akademický článek
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Autor:
Michael Daas, Fabian Hügging, Norbert Wermes, Jens Janssen, Y. Dieter, Tianyang Wang, David-leon Pohl, Jochen Dingfelder, Pascal Wolf, M. Vogt, Hans Krüger, T. Hemperek
The radiation hardness of passive CMOS pixel sensors fabricated in 150 nm LFoundry technology is investigated. CMOS process lines are especially of interest for large-scale silicon detectors as they offer high production throughput at comparatively l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::727c3bb858bef4197e5a33b1ce567824
Autor:
Fabian Hügging, Norbert Wermes, Michael Daas, G. Giakoustidis, T. Wang, Hans Krüger, P. Rymaszewski, Tomasz Hemperek, Jochen Dingfelder, Y. Dieter, F. Hinterkeuser, M. Frohne, D. Pohl, M. Standke, M. Vogt, Jens Janssen
BDAQ53 is a readout system and verification framework for hybrid pixel detector readout chips of the RD53 family. These chips are designed for the upgrade of the inner tracking detectors of the ATLAS and CMS experiments. BDAQ53 is used in application
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a64fe3a4a2b853e0bc67708608bbf0c
http://arxiv.org/abs/2005.11225
http://arxiv.org/abs/2005.11225