Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Y. A. See"'
Publikováno v:
05.01 - Airway pharmacology and treatment.
Publikováno v:
05.01 - Airway pharmacology and treatment.
Autor:
S. Z. Rahaman, Y.-J. Chang, Y.-C. Hsin, S.-Y. Yang, F.-M. Chen, K.-M. Chen, I-J. Wang, H.-H. Lee, G.-L. Chen, Y.-H. Su, C.-Y. Shih, S.-C. Chiu, J.-H. Wei, S.-C. Yen, K.-C. Huang, C.-C. Chen, M.-C. Chen, S.-S. Sheu, W.-C. Lo, S.-Z. Chang, Y.-C. See, D.-L. Deng, C.-I Wu
Publikováno v:
2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
Autor:
Y. J. See, Mohd H Ismail
Publikováno v:
2021 IEEE 19th Student Conference on Research and Development (SCOReD).
Autor:
Saw Jian Jing, Y. C. See
Publikováno v:
2019 4th International Conference and Workshops on Recent Advances and Innovations in Engineering (ICRAIE).
Wall outlets are standard household devices that could be found in our homes and commercial areas. Occasionally, energy is wasted if the sockets are left switched on unintentionally. It is difficult to be detected without the aid of a measuring or mo
Publikováno v:
TENCON 2017 - 2017 IEEE Region 10 Conference.
Face recognition on a tilted face with expression poses challenging tasks. This paper presents an investigation of face recognition based on a Gabor Filter and Oriented Gabor Phase Congruency Image with Random Forest. Gabor Filter (GF) gives the magn
Autor:
Georgios Vellianitis, Martin Christopher Holland, Carlos H. Diaz, Blandine Duriez, Matthias Passlack, Aryan Afzalian, Richard Kenneth Oxland, M.J.H. van Dal, Y. C. See, Gerben Doornbos
Publikováno v:
2014 IEEE International Electron Devices Meeting.
Whilst high performance p-channel Ge MOSFETs have been demonstrated [1–4], Ge n-channel MOSFET drive current has been lagging behind mainly hampered by high access resistance and poor gate stack passivation [5–9]. In this work, we address these i
Autor:
C. H. Diaz, Richard Kenneth Oxland, K. M. Yin, M.J.H. van Dal, C. H. Hsieh, Y. S. Chang, Georgios Vellianitis, Krishna Kumar Bhuwalka, Blandine Duriez, Gerben Doornbos, Y. C. See, Matthias Passlack, Martin Christopher Holland
Publikováno v:
2013 IEEE International Electron Devices Meeting.
We demonstrate scaled, replacement gate high-k/metal gate p-channel Ge FinFETs integrated onto 300mm Si wafers for which the best device shows record peak gm, ext=2.7mS/μm (gm, int=3.3mS/μm), Q (≡gm, ext/SSsat) = 32.4 and Ion= 497μA/μm at Ioff
Autor:
Y. A. See, K. C. Khoo
Publikováno v:
Bulletin of Entomological Research. 86:467-474
The relationship between abundance of Dolichoderus thoracicus (Smith) and damage to cocoa pods caused by Conopomorpha cramerella Snellen was examined in a series of experiments. Pods were harvested from ant-abundant and ant-scarce plots and categoriz
Publikováno v:
IFMBE Proceedings ISBN: 9783642217289
Lower back pain causes discomfort in many individuals. If left untreated and allowed to deteriorate, discomfort might lead to disability. Lower back pain is linked with the degeneration of the inter-vertebral disc (IVD), also known as degenerative di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dc3f6638e426677e63806b442a10a974
https://doi.org/10.1007/978-3-642-21729-6_8
https://doi.org/10.1007/978-3-642-21729-6_8