Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Xumin William Shen"'
Autor:
Stephen Lam, Christopher Hess, Larg Weiland, Matthew Moe, Xumin William Shen, John Chen, Indranil De, Marcin Strojwas, Tomasz Brozek
Publikováno v:
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::027c64ed898352bea5444e9f217de04d
https://doi.org/10.1109/icmts50340.2022.9898254
https://doi.org/10.1109/icmts50340.2022.9898254
Autor:
Andrzej J. Strojwas, Tomasz Brozek, Kelvin Doong, Indranil De, Xumin William Shen, Marcin Strojwas
Publikováno v:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6162a4a0cf966db4771f3524a53e0466
https://doi.org/10.1109/edtm53872.2022.9798308
https://doi.org/10.1109/edtm53872.2022.9798308