Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Xujie Tong"'
Autor:
Xujie Tong, Vishal Dhamgaye, Qiucheng Chen, Qingxin Wu, Biao Deng, Ling Zhang, Oliver Fox, Hongchang Wang, Jun Zhao, Yifang Chen, Zijian Xu, Peng Li, Kawal Sawhney
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 6, Pp 1457-1463 (2024)
Hard X-ray microscopes with 20–30 nm spatial resolution ranges are an advanced tool for the inspection of materials at the nanoscale. However, the limited efficiency of the focusing optics, for example, a Fresnel zone plate (ZP) lens, can significa
Externí odkaz:
https://doaj.org/article/150d156a455644acab2b0f6af58674cf
Autor:
Xujie Tong, Yifang Chen, Zijian Xu, Yijie Li, Zhenjiang Xing, Chengyang Mu, Jun Zhao, Xiangjun Zhen, Chengwen Mao, Renzhong Tai
Publikováno v:
Journal of Synchrotron Radiation, Vol 30, Iss 2, Pp 319-326 (2023)
With fast advances in enhancing the focusing/imaging resolution of Fresnel zone plate lenses toward sub-10 nm, low diffraction efficiency in connection with their rectangular zone shape still remains a big issue in both soft and hard X-ray microscopy
Externí odkaz:
https://doaj.org/article/3f21290d1787420da604c0480dddad9e
Autor:
Xujie Tong, Yifang Chen, Zijian Xu, Yijie Li, Zhenjiang Xing, Chengyang Mu, Jun Zhao, Xiangjun Zhen, Chengwen Mao, Renzhong Tai
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 2, Pp 386-392 (2022)
X-ray microscopes are powerful tools in the nano-inspection of materials owing to their ultra-high resolution at the molecular level. However, the focusing efficiency of binary zone plate lenses as key components in such probes is merely 5% in practi
Externí odkaz:
https://doaj.org/article/3fecbe87fc6d4646a78e781046337141
Autor:
Tao Liu, Xujie Tong, Shuoqiu Tian, Yuying Xie, Mingsai Zhu, Bo Feng, Xiaohang Pan, Rui Zheng, Shan Wu, Ding Zhao, Yifang Chen, Bingrui Lu, Min Qiu
Publikováno v:
Nanoscale. 14(25)
Due to the perfection of the nanofabrication in nanotechnology and nanoscience, ice lithography (IL) by patterning ice thin-films with a focused electron beam, as a significant derivative technology of electron beam lithography (EBL), is attracting g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9bcb31712449d899793347c707abb294
https://pubmed.ncbi.nlm.nih.gov/35703448
https://pubmed.ncbi.nlm.nih.gov/35703448
Autor:
Xujie Tong, Yifang Chen, Chengyang Mu, Qiucheng Chen, Xiangzhi Zhang, Guang Zeng, Yuchun Li, Zijian Xu, Jun Zhao, Xiangjun Zhen, Chengwen Mao, Hongliang Lu, Renzhong Tai
Publikováno v:
Nanotechnology. 34:215301
X-ray microscope as an important nanoprobing tool plays a prevailing role in nano-inspections of materials. Despite the fast advances of high resolution focusing/imaging reported, the efficiency of existing high-resolution zone plates is mostly aroun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e587dc32ced326c2cdc9685650fe1271
https://doi.org/10.1088/1361-6528/acb946
https://doi.org/10.1088/1361-6528/acb946
Publikováno v:
Microelectronic Engineering. 273:111965
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ba19e057837eca035412c55592b8407
https://doi.org/10.1016/j.mee.2023.111965
https://doi.org/10.1016/j.mee.2023.111965
Autor:
Xujie Tong, Yifang Chen, Chengyang Mu, Qiucheng Chen, Xiangzhi Zhang, Guang Zeng, Yu-Chun Li, Zijian Xu, Jun Zhao, Xiangjun Zhen, Chengwen Mao, Hongliang Lu, Renzhong Tai
X-ray microscope as an important nanoprobing tool is expected to play a powerful role in nano-inspections of materials. Despite the fast advances of high resolution focusing/imaging reported, the diffraction efficiency of existing binary zone plates
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb8df7654be9c3bb34f29ac4023d7876
https://doi.org/10.21203/rs.3.rs-1353055/v1
https://doi.org/10.21203/rs.3.rs-1353055/v1
Publikováno v:
Microelectronic Engineering. 251:111640
Despite self-supporting ultrathin Si membranes are already being widely applied, its thickness control in micron scale still remains a big challenge for delicate systems such as micro-opto-electro-mechanical systems and silicon-based X-ray diffractiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57de55497b3803485b442f6dcced61a6
https://doi.org/10.1016/j.mee.2021.111640
https://doi.org/10.1016/j.mee.2021.111640
Publikováno v:
Microelectronic Engineering. 234:111435
For high quality imaging of materials in nanoscale by hard X-ray optics, high resolution lenses with high focusing/imaging efficiency are needed. Refraction based conventional Kinoform lenses with 1D linear configuration in Si has been attempted for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ceb8327babb3c90c303431816e40becb
https://doi.org/10.1016/j.mee.2020.111435
https://doi.org/10.1016/j.mee.2020.111435