Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Xu, Xufei"'
Autor:
Xu Xufei, Shimada Kazutaka
Publikováno v:
EPiC Series in Computing.
Sarcasm is generally characterized as ironic or satirical that is intended to blame, mock, or amuse in an implied way. Recently, pre-trained language models, such as BERT, have achieved remarkable success in sarcasm detection. However, there are many
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09227dc723d7f5380e15084b5b88464c
https://doi.org/10.29007/zbzq
https://doi.org/10.29007/zbzq
Autor:
Xiaojie Zhang, Yangsik Youn, Zhang Zhihai, Shen Qiyu, Liu Zhaofan, Jianwei Wang, SeungKyu Lee, Xu Xufei, Junsheng Chen, Zuhong Liu, Yijun Wang
Publikováno v:
SID Symposium Digest of Technical Papers. 50:1495-1498
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd28991e20ff2516abfb47fe310ead18
https://doi.org/10.1002/sdtp.13225
https://doi.org/10.1002/sdtp.13225
Autor:
Wang, Yijun, Wang, Sheng, Zang, Yuansheng, Wang, Hui, Liu, Yuqi, Fang, Kaidi, Zhou, Ru, Yang, Jie, Xu, Xufei, Zhang, Xiaojie, Zhu, Zhengwei, Zhang, Jun, Wang, Chun, Liu, Zhaofan, Lee, SeungKyu
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, p129-131, 3p
Autor:
Jidong Han, Song Jie, Wang Yijun, Chuncheng Che, Shen Qiyu, Chengkui Li, Zhao Na, Xu Xufei, Dong Chen, Yangzhi Yin, Shi Gaofei
Publikováno v:
SID Symposium Digest of Technical Papers. 46:1341-1343
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f6cb9e8d568eacebfd1d1298d9cfd60
https://doi.org/10.1002/sdtp.10120
https://doi.org/10.1002/sdtp.10120
Autor:
Wang, Yijun, Shen, Qiyu, Wang, Jianwei, Liu, Zuhong, Xu, Xufei, Liu, Zhaofan, Zhang, Xiaojie, Zhang, Zhihai, Youn, YangSik, Chen, Junsheng, Lee, SeungKyu
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2019, Vol. 50 Issue 1, p1495-1498, 4p
Autor:
Zhao, Na, Shen, Qiyu, Shi, Gaofei, Xu, Xufei, Wang, Yijun, Song, Jie, Han, Jidong, Yin, Yangzhi, Chen, Dong, Che, Chuncheng, Li, Chengkui
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2015, Vol. 46 Issue 1, p1341-1343, 3p