Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Xlaowei Li"'
Publikováno v:
Asian Test Symposium
Dual threshold voltage design is the most effective technique for reducing leakage current of integrated circuits. In this paper, we put forward an average leakage current macromodeling for dual-threshold circuits and propose two methods to conquer i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc953f6cc3e778aadb9021c865703cce
https://doi.org/10.1109/ats.2003.1250809
https://doi.org/10.1109/ats.2003.1250809
Publikováno v:
Test Symposium, 2003. ATS 2003. 12th Asian; 2003, p196-201, 6p