Zobrazeno 1 - 10
of 39
pro vyhledávání: '"Xingjian Yi"'
Autor:
Wolfgang Kubin
Publikováno v:
Kindlers Literatur Lexikon (KLL) ISBN: 9783476057280
Kindlers Literatur Lexikon (KLL)
Kindlers Literatur Lexikon (KLL)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::219bd40e26e94b6aaff8696458e8f642
https://doi.org/10.1007/978-3-476-05728-0_11501-1
https://doi.org/10.1007/978-3-476-05728-0_11501-1
Autor:
Ran Chen, Jing Zhao, Xueqi Yao, Yueheng He, Yuting Li, Zeke Lian, Zhengqi Han, Xingjian Yi, Haoran Li
Publikováno v:
Land, Vol 13, Iss 2, p 254 (2024)
In urban ecological development, the effective planning and design of living spaces are crucial. Traditional color plan rendering methods, mainly using generative adversarial networks (GANs), rely heavily on edge extraction. This often leads to the l
Externí odkaz:
https://doaj.org/article/a356911d311647558d45d409a8e751ee
Publikováno v:
Applied Economics Letters. :1-6
Publikováno v:
International Review of Economics & Finance. 80:225-242
Publikováno v:
China & World Economy. 28:64-93
In this paper, we investigate the effect of digital financial inclusion (DFI) on household consumption smoothing in China. We use four waves of the biennial China Family Panel Studies from 2010 to 2016, during which time DFI has significantly develop
Publikováno v:
SSRN Electronic Journal.
This paper investigates the degree of risk sharing across households in China with heterogeneous risk and time preferences from the late 1990s to early 2010s. Standard tests assume homogeneous preferences across households, which may bias the true ri
Autor:
Zhang, Qi1 (AUTHOR), Yuan, Yifei1 (AUTHOR) yuanyifei993@163.com
Publikováno v:
PLoS ONE. 12/2/2024, Vol. 19 Issue 12, p1-21. 21p.
Autor:
Bifeng Xiong, Changhong Chen, Hongchen Wang, Yingrui Wang, Xingjian Yi, Luqin Liu, Sihai Chen
Publikováno v:
Infrared Physics & Technology. 44:137-141
A new method for fabrication of VOx thin film on substrates of silicon (1 0 0) and quartz glass has been described. The metallic vanadium thin films were deposited by ion beam sputtering followed by a post-deposition oxidation. The X-ray diffractomet
Autor:
Li, Wei1 (AUTHOR), Wang, Hui2 (AUTHOR), Zhang, Lu1 (AUTHOR) ahxhzhanglu@sina.com, Liu, Runchen1 (AUTHOR)
Publikováno v:
PLoS ONE. 8/24/2023, Vol. 18 Issue 8, p1-22. 22p.
Publikováno v:
Science Technology & Engineering. 2023, Vol. 23 Issue 10, p4234-4246. 13p.