Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Xingdi Zhang"'
Publikováno v:
IEEE Transactions on Visualization and Computer Graphics. 28:281-290
State-of-the-art computation and visualization of vortices in unsteady fluid flow employ objective vortex criteria, which makes them independent of reference frames or observers. However, objectivity by itself, although crucial, is not sufficient to
Autor:
Yu Zhang, Shirui Yu, Jiaqi Liu, Renyang Meng, Yin Long, Kai Wang, Kun Cai, Xingdi Zhang, Xinghua Song, Jiadong Ren, Abhishek Vikram, Changlian Yan, Guojie Cheng, Hui Wang, Qing Zhang, Wenkui Liao
Publikováno v:
2021 International Workshop on Advanced Patterning Solutions (IWAPS).
Publikováno v:
2021 China Semiconductor Technology International Conference (CSTIC).
As shrinkage of design nodes and increase of pattern density, defects become more and more critical in the integrated circuit (IC) manufacturing. Capturing more defects is essential in defects reduction which is the key point in yield enhance. Broadb
Autor:
Hui Wang, Qing Zhang, Jiaqi Liu, Changlian Yan, Yu Zhang, Long Yin, Xingdi Zhang, Guojie Cheng, Wenkui Liao, Abhishek Vikram, Renyang Meng, Xinghua Song, Kai Wang, Kun Cai, Shirui Yu, Jiadong Ren
Publikováno v:
Design-Process-Technology Co-optimization XV.
The importance of pattern-based defect study has grown with more complex processes in advanced semiconductor manufacturing. The pattern is the heart of the DPTCO Design Process Technology Co-Optimization approach. But the definition of pattern has be
Publikováno v:
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Process window limiting structures (PWLS) evaluated with process window discovery methodology (PWD) was studied on 28nm and beyond technology node wafers. Process window discovery methodology was innovated basing on process window qualification (PWQ)
Publikováno v:
2020 China Semiconductor Technology International Conference (CSTIC).
In this paper, 3bar structure Cu void defects are detected and monitored by using brightfiled inspection system in 28nm back-end-of-the-line (BEOL) processes. 3bar structure Cu void defects were studied by a novel combination of dedicated scan settin
Publikováno v:
Journal of materials chemistry. B. 5(22)
Natural antibodies are used widely for various applications such as in biomedical analysis, protein separation, and targeted-drug delivery, but they suffer from high cost and low stability. In this study, we developed a facile approach for the constr
Publikováno v:
IEEE Photonics Technology Letters. 29:66-69
We report microsphere resonators fabricated with a gallium germanium antimony sulfide (2S2G) chalcogenide glass and demonstrate whispering gallery modes (WGMs) in the wavelength range of 1.65– $2~\mu \text{m}$ . Typical quality factors ( $Q$ factor
Publikováno v:
VCIP
Construct a High Dynamic Range (HDR) image is the primary method to solve the information loss caused by insufficient dynamic range of cameras. We propose a technique for fusing a bracketed low dynamic range (LDR) image sequence of varying exposures
Publikováno v:
High Performance Polymers. 28:1210-1217
It’s a long-standing task to explore the toughening effect of fiber-reinforced thermoplastic composites, which could be used to produce new materials demanded by the aerospace field. In this work, we investigated the effects of the molecular weight