Zobrazeno 1 - 10
of 256
pro vyhledávání: '"Xinfan Huang"'
Autor:
Hengping Dong, Kunji Chen, Huafeng Yang, Zhongyuan Ma, Jun Xu, Wei Li, Linwei Yu, Xinfan Huang
Publikováno v:
APL Photonics, Vol 7, Iss 2, Pp 026102-026102-9 (2022)
The photoresponsivity and response speed are two key figures of merit for the photodetector (PD). According to the previous reports, there is an inherent contradiction between high photoresponsivity and fast response speed in normal photoconductive-t
Externí odkaz:
https://doaj.org/article/86e5d518e2bd40dcbddec906e5435267
Publikováno v:
Frontiers in Physics, Vol 7 (2019)
Silicon oxynitride films are one kind of important gate dielectric materials for applications in the fabrication of silicon CMOS integrated circuits (ICs), which have been widely and deeply studied. However, with the significant demand of the technol
Externí odkaz:
https://doaj.org/article/2a13845d717541949839927e86ec8bd6
Autor:
Zhongyuan Ma, Wen Wang, Huafeng Yang, Xiaofan Jiang, Jie Yu, Hua Qin, Ling Xu, Kunji Chen, Xinfan Huang, Wei Li, Jun Xu, Duan Feng
Publikováno v:
Journal of Applied Physics; 2/21/2016, Vol. 119 Issue 7, p075702-1-075702-6, 6p, 3 Diagrams, 5 Graphs
Autor:
Jie Yu, Kunji Chen, Zhongyuan Ma, Xinxin Zhang, Xiaofan Jiang, Xinfan Huang, Yongxing Zhang, Lingling Wang
Publikováno v:
Journal of Applied Physics; 2016, Vol. 119 Issue 4, p1-5, 5p, 1 Color Photograph, 4 Graphs
Autor:
Huafeng Yang, Ling Xu, Kunji Chen, Zhongyuan Ma, Xiaofan Jiang, Sheng Ren, Jun Xu, Wei Li, Xinfan Huang, Duan Feng, Jie Yu
Publikováno v:
physica status solidi (a). 213:1878-1884
In this study, we investigate the microstructure and formation of segregated silicon nanocrystals (nc-Si) from annealed Si-rich SixN/SiyN multilayers. It is found the nc-Si are separated and arranged in every sublayer with two different grain sizes.
Publikováno v:
Journal of Applied Physics. 128:184902
Memristors with tunable conductance characteristics have attracted great attention in high density memory and neuromorphic computing. However, the dynamics of conductance change for filamentary-type memristors is generally asymmetric: The set transit
Publikováno v:
2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
In this paper, we systematically investigated the dependence of three types of bottom electrode (BE) materials, such as active Cu and Ag, inert Pt and Au, and oxygen-affinity W and Ti, on resistive switching characteristics for HfO 2 /TiO x bilayer s
Publikováno v:
2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Mechanism of conductive defect states based filament for MOM (metal/oxide/metal) resistive switching structures has been proposed. Emphasis is given on the point defects of silicon dangling bonds percolation model in oxide semiconductor Pt/SiO x /Pt
Autor:
Jian, Liu, Huafeng, Yang, Yang, Ji, Zhongyuan, Ma, Kunji, Chen, Xinxin, Zhang, Hui, Zhang, Yang, Sun, Xinfan, Huang, Shunri, Oda
Publikováno v:
Nanotechnology. 29(41)
We reported on a Ti/HfO
Autor:
Xiaofan Jiang, Zhongyuan Ma, Huafeng Yang, Jie Yu, Wen Wang, Wenping Zhang, Wei Li, Jun Xu, Ling Xu, Kunji Chen, Xinfan Huang, Duan Feng
Publikováno v:
Journal of Applied Physics; 2014, Vol. 116 Issue 12, p1-5, 5p, 3 Color Photographs, 1 Black and White Photograph, 6 Graphs