Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Xin Zan Liu"'
Autor:
Chaohui He, Shu Huan Liu, Xin Du, Xin Zan Liu, Lin Gang Zhang, Yong Hong Li, Dong Sheng He, Cen Xiong, Du Tang, Wei Chen, Xue Cheng Du, Yun Yun Fan, Yao Zhang, Hang Zang
Publikováno v:
Applied Mechanics and Materials. 678:252-259
We designed radiation effect experimental system including current measurement section and functional test section for Xilinx Zynq-7010 System on chip (SoC) and performed the Total Ionizing Dose (TID) experiment irradiated by Co60 γ-source on the ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c1c67a7d63da90619a494791d856a183
https://doi.org/10.4028/www.scientific.net/amm.678.252
https://doi.org/10.4028/www.scientific.net/amm.678.252
Autor:
Yao Zhang, Wei Chen, Chaohui He, Xin Zan Liu, Yong Hong Li, Dong Sheng He, Xin Du, Xue Cheng Du, Shu Huan Liu
Publikováno v:
Applied Mechanics and Materials. 678:268-273
Estimating the radiation sensitivity and radiation response of individual electronic units embedded in System on chip (SoC) is important for SoC error rate predicting and fault tolerant system designing. In this paper, the experimental techniques for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb6cf22a3304b20af499f44459a421b1
https://doi.org/10.4028/www.scientific.net/amm.678.268
https://doi.org/10.4028/www.scientific.net/amm.678.268