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Autor:
Laz Padron, Yan Chen, John Kuhn, Xiaoyen (Kathy) Guo, William T.K. Stevenson, Joseph Hodkiewicz, Thayne Vickstrom, Tania Dyakonov, Bin Huang
Publikováno v:
Applied Spectroscopy. 53:1403-1411
The thermal volatilization analysis (TVA) and subambient thermal volatilization analysis (SATVA) techniques are described. In addition to rate profiling of the volatile product flux of thermal degradation under high-vacuum conditions through measurem