Zobrazeno 1 - 8
of 8
pro vyhledávání: '"XiLin Yao"'
Publikováno v:
Materials Research, Vol 27 (2024)
TC4 (Ti6Al4V) alloy is widely used in aerospace, medical equipment, food industry and other fields. Laser powder bed fusion (LPBF) technology has a short production cycle and high precision for formed parts, providing new ideas for the manufacturing
Externí odkaz:
https://doaj.org/article/0c787008884f4025be7dcb0b1e1afc90
Autor:
Jiaming Xu, Hengyang Li, Huaizhi Zhang, Shuo Li, Wei Cheng, Xilin Yao, Gang Xu, Yu Xiao, Xiahui Tang, Yingxiong Qin
Publikováno v:
Applied Physics Letters. 122:091102
It is of great significance to control the energy, location, topological charge, and other parameters of each beam in three-dimensional space. Thus, optical array is proposed and widely used in processing, communication, microscopy, storage, and othe
Autor:
Chunhua Xia, Guowei Sang, Yan Liang, Xilin Yao, Haiping Hao, Lin Xie, Chaonan Zheng, Xuan Wang, Guangji Wang, Xiaolan Wu
Publikováno v:
Journal of Mass Spectrometry. 44:230-244
The paper presents a modified and universally applicable diagnostic fragment-ion-based extension strategy (DFIBES) to efficiently process the information acquired by liquid chromatography-electrospray ionization source in combination with hybrid ion
Publikováno v:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies.
In this paper, a novel method, changeable wavelength optical thickness monitoring with quartz crystal thickness monitoring, is firstly outlined for monitoring non-quarter wave thickness. For several multi-layer optical coatings with high performance,
Publikováno v:
SPIE Proceedings.
Firstly, a reverse synthesis method is outlined for the determination of the optical constants of infrared coatings from transmittance spectrum data by optimizing the physical thickness, refractive index and extinction coefficient, which can apply to
Publikováno v:
SPIE Proceedings.
"Reverse Engineering" attempts to derive information about the makeup of an existing optical coating from optical spectrum measurements, usually of performance, which can be converted into targets for inverse optimization synthesis. In the method of
Publikováno v:
SPIE Proceedings.
Optical spectrum measurements are commonly used for the routine determination of thin film optical constants. This paper presents some new methods of evaluating transmission spectrum data only, leading to thickness and values for the complex refracti
Publikováno v:
Plasma Science & Technology; Dec2005, Vol. 7 Issue 6, p1-1, 1p