On Using Cell-Aware Methodology for SRAM Bit Cell Testing

Autor: Xhafa, Xh., Ladhar, A., Faehn, E., Anghel, L., Di Pendina, G., Girard, P., Virazel, A.

Publikováno v: 2023 IEEE European Test Symposium (ETS)
2023 IEEE European Test Symposium (ETS), May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______3515::f48cf55aba8334cfd3b31908063eb07c
https://hal.science/hal-04164704