Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Xavier Kerbiriou"'
Publikováno v:
Journal of Physics D: Applied Physics
Journal of Physics D: Applied Physics, IOP Publishing, 2012, 45, pp.465301. ⟨10.1088/0022-3727/45/46/465301⟩
Journal of Physics D: Applied Physics, 2012, 45, pp.465301. ⟨10.1088/0022-3727/45/46/465301⟩
Journal of Physics D: Applied Physics, IOP Publishing, 2012, 45, pp.465301. ⟨10.1088/0022-3727/45/46/465301⟩
Journal of Physics D: Applied Physics, 2012, 45, pp.465301. ⟨10.1088/0022-3727/45/46/465301⟩
3C-SiC single crystal epitaxial layers, 6H-SiC single crystal plates and α-SiC Hexoloy sinters were irradiated with 4.0 MeV Xe or 4.0 MeV Au ions at room temperature. Mechanical and dimensional evolutions of silicon carbide are studied by means of n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba942a36be99c093d7802ba76d06d08f
http://hal.in2p3.fr/in2p3-00752985
http://hal.in2p3.fr/in2p3-00752985
Autor:
L. Gosmain, Xavier Kerbiriou, Jean-Marc Costantini, Georges Calas, Christina Trautmann, S. Sorieul
Publikováno v:
Journal of Physics: Condensed Matter
Journal of Physics: Condensed Matter, IOP Publishing, 2012, 24, pp.125801. ⟨10.1088/0953-8984/24/12/125801⟩
Journal of Physics: Condensed Matter, 2012, 24, pp.125801. ⟨10.1088/0953-8984/24/12/125801⟩
Journal of Physics: Condensed Matter, IOP Publishing, 2012, 24, pp.125801. ⟨10.1088/0953-8984/24/12/125801⟩
Journal of Physics: Condensed Matter, 2012, 24, pp.125801. ⟨10.1088/0953-8984/24/12/125801⟩
International audience; Single crystals of 4H-SiC were irradiated with swift heavy ions (332 MeV Ti, 106 MeV Pb and 2.7 GeV U) in the electronic energy loss regime. The resulting damage was investigated with UV-visible optical absorption spectroscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ee6a4d03c93cdbd1147c2eebd291356
https://hal.archives-ouvertes.fr/hal-00675478
https://hal.archives-ouvertes.fr/hal-00675478
Autor:
Jacek Jagielski, Jean-Marc Costantini, Xavier Kerbiriou, Lionel Thomé, Maxime Sauzay, Jean-Jacques Grob, S. Sorieul
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2009, 105, pp.073513. ⟨10.1063/1.3103771⟩
Journal of Applied Physics, American Institute of Physics, 2009, 105, pp.073513. ⟨10.1063/1.3103771⟩
Journal of Applied Physics, 2009, 105, pp.073513. ⟨10.1063/1.3103771⟩
Journal of Applied Physics, American Institute of Physics, 2009, 105, pp.073513. ⟨10.1063/1.3103771⟩
Structural, mechanical, and dimensional evolutions of silicon carbide (SiC) induced by heavy-ion irradiations are studied by means of Rutherford backscattering spectrometry and channeling (RBS/C), nanoindentation, and surface profilometry measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::165155317518ca7f2d2695bad88fd54f
https://hal.in2p3.fr/in2p3-00674943
https://hal.in2p3.fr/in2p3-00674943