BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits

Autor: Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragones, Xavier Perpiñà, Ferran Reverter

Publikováno v: Sensors, Vol 21, Iss 3, p 805 (2021)

A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised tw

Externí odkaz: https://doaj.org/article/4594b16652a54b5498d8442a7bdd9382

Aging in CMOS RF linear power amplifiers: an experimental study

Autor: Albert Crespo-Yepes, Javier Martin-Martinez, Enrique Barajas, Xavier Aragones, R. Rodriguez, Montserrat Nafria, Diego Mateo

Publikováno v: Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)

© 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new c

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::da062c0c83c73c1ee31b5e773b93cfdc
https://hdl.handle.net/2117/343811

Differential temperature sensors: Review of applications in the test and characterization of circuits, usage and design methodology

Autor: Diego Mateo, Josep Altet, Enrique Barajas, Xavier Aragones

Publikováno v: Sensors, Vol 19, Iss 21, p 4815 (2019)
Sensors (Basel, Switzerland)
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)

Differential temperature sensors can be placed in integrated circuits to extract a signature of the power dissipated by the adjacent circuit blocks built in the same silicon die. This review paper first discusses the singularity that differential tem

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e543a67769a395ba009ed8957dd991f2
https://hdl.handle.net/2117/178636

A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI

Autor: Elisenda Roca, Xavier Aragones, Javier Diaz-Fortuny, Francisco V. Fernández, Enrique Barajas, Rafael Castro-Lopez, R. Rodriguez, Javier Martin-Martinez, Montserrat Nafria, Diego Mateo

Publikováno v: Recercat. Dipósit de la Recerca de Catalunya
instname
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
idUS. Depósito de Investigación de la Universidad de Sevilla
Digital.CSIC. Repositorio Institucional del CSIC
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona

Statistical characterization of CMOS transistor variability phenomena in modern nanometer technologies is key for accurate end-of-life prediction. This work presents a novel CMOS transistor array chip to statistically characterize the effects of seve

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3a310c96a2b51c1e981f8cb6a273a3de
https://hdl.handle.net/2117/126049

A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging

Autor: Diego Mateo, Elisenda Roca, Xavier Aragones, Francisco V. Fernández, Rafael Castro-Lopez, Rosana Rodriguez, Montserrat Nafria, Javier Diaz-Fortuny, E. Barajas, Javier Martin-Martinez

Publikováno v: SMACD

In this work, a CMOS transistor array is presented, which allows performing process variability, Random Telegraph Noise and BTI/CHC aging characterization in a single chip. The array, called ENDURANCE, integrates 3136 MOS transistors, for single and

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::54d6a06ea002773eef81cbe7407e7085
https://doi.org/10.1109/smacd.2017.7981600