Zobrazeno 1 - 10
of 55
pro vyhledávání: '"XS Miao"'
Publikováno v:
Japanese Journal of Applied Physics. 44:3612
An initialization-free method of producing blue-laser rewritable optical discs is proposed. After designing the disc, finding a suitable additional layer material and optimizing the film thickness of each layer, the initialization-free Blu-ray Disc w
Publikováno v:
Acta Crystallographica Section C Crystal Structure Communications. 52:2582-2583
The title compound, C12H6Cl4, 2,2',5,5'-tetrachlorobiphenyl, crystallized in the monoclinic space group C2/c. The dihedral angle and bond length between the two phenyl rings are 59.0 degrees and 1.467(14) Angstrom, respectively. The ortho- and meta-C
Autor:
Ren SG; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Dong AW; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Yang L; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Xue YB; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Li JC; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Yu YJ; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Zhou HJ; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Zuo WB; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China., Li Y; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China.; Hubei Yangtze Memory Laboratories, Wuhan, 430205, China., Cheng WM; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China.; Hubei Yangtze Memory Laboratories, Wuhan, 430205, China., Miao XS; School of Integrated Circuits, Hubei Key Laboratory of Advanced Memories, Huazhong University of Science and Technology, Wuhan, 430074, China.; Hubei Yangtze Memory Laboratories, Wuhan, 430205, China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Jan; Vol. 36 (4), pp. e2307218. Date of Electronic Publication: 2023 Nov 27.
Autor:
You QQ; Department of Medical Ultrasound, Qingpu Brance of Zhongshan Hospital, Fudan University School of Medicine, No. 1158 East Park Road, Shanghai 201700, China., Peng SY; Department of Medical Ultrasound, Qingpu Brance of Zhongshan Hospital, Fudan University School of Medicine, No. 1158 East Park Road, Shanghai 201700, China., Zhou ZY; Department of Medical Ultrasound, Qingpu Brance of Zhongshan Hospital, Fudan University School of Medicine, No. 1158 East Park Road, Shanghai 201700, China., Tan XL; Department of Medical Ultrasound, Qingpu Brance of Zhongshan Hospital, Fudan University School of Medicine, No. 1158 East Park Road, Shanghai 201700, China., Miao XS; Department of Medical Ultrasound, Qingpu Brance of Zhongshan Hospital, Fudan University School of Medicine, No. 1158 East Park Road, Shanghai 201700, China.
Publikováno v:
Contrast media & molecular imaging [Contrast Media Mol Imaging] 2022 May 09; Vol. 2022, pp. 6425145. Date of Electronic Publication: 2022 May 09 (Print Publication: 2022).
Autor:
He HK; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn.; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Jiang YB; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Yu J; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Yang ZY; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn., Li CF; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, NRC (Nanostructure Research Centre), Wuhan University of Technology, China., Wang TZ; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn.; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Dong DQ; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn.; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Zhuge FW; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Xu M; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn., Hu ZY; State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, NRC (Nanostructure Research Centre), Wuhan University of Technology, China., Yang R; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn.; State Key Laboratory of Material Processing and Die & Mould Technology, School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China., Miao XS; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, China. yangrui@hust.edu.cn.
Publikováno v:
Materials horizons [Mater Horiz] 2022 Mar 07; Vol. 9 (3), pp. 1036-1044. Date of Electronic Publication: 2022 Mar 07.
Autor:
Wang K; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China. heyuhui@hust.edu.cn tonghao@hust.edu.cn miaoxs@hust.edu.cn., Hu Q, Gao B, Lin Q, Zhuge FW, Zhang DY, Wang L, He YH, Scheicher RH, Tong H, Miao XS
Publikováno v:
Materials horizons [Mater Horiz] 2021 Feb 01; Vol. 8 (2), pp. 619-629. Date of Electronic Publication: 2020 Dec 14.
Autor:
Fu Y; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China. heyuhui@hust.edu.cn miaoxs@hust.edu.cn., Dong B, Su WC, Lin CY, Zhou KJ, Chang TC, Zhuge F, Li Y, He Y, Gao B, Miao XS
Publikováno v:
Nanoscale [Nanoscale] 2020 Nov 26; Vol. 12 (45), pp. 22970-22977.
Autor:
Yuan JH; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China. xkh@hust.edu.cn., Mao GQ, Xue KH, Wang J, Miao XS
Publikováno v:
Nanoscale [Nanoscale] 2020 Jul 14; Vol. 12 (26), pp. 14150-14159. Date of Electronic Publication: 2020 Jun 29.
Autor:
Yuan JH; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China., Li LH; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China., Zhang W; Department of Chemistry, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, United States., Xue KH; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China., Wang C; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China., Wang J; School of Science, Wuhan University of Technology, Wuhan 430070, China., Miao XS; Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China., Zeng XC; Department of Chemistry, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2020 Mar 25; Vol. 12 (12), pp. 13896-13903. Date of Electronic Publication: 2020 Mar 13.
Autor:
Pan W; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Yang B; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Niu G; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Xue KH; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Du X; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Yin L; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Zhang M; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Wu H; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Miao XS; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China., Tang J; Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, 430074, Hubei Province, China.
Publikováno v:
Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2019 Nov; Vol. 31 (44), pp. e1904405. Date of Electronic Publication: 2019 Sep 16.