Zobrazeno 1 - 10
of 51
pro vyhledávání: '"XIE, Jianyun"'
Publikováno v:
Shiyan dongwu yu bijiao yixue, Vol 43, Iss 5, Pp 566-573 (2023)
Objective To establish a method for rapid and sensitive detection of Staphylococcus aureus.Methods The specific gene nuc of Staphylococcus aureus was selected as the target gene. A pair of specific primers and a TaqMan probe were designed and synthes
Externí odkaz:
https://doaj.org/article/d35922ea0cd6477aa10ccad5f1f7f4f6
Autor:
XIE Jianyun
Publikováno v:
Shiyan dongwu yu bijiao yixue, Vol 43, Iss 5, Pp 482-491 (2023)
Microtus fortis (reed vole) is the only mammal known to have natural resistance to Schistosomiasis japonica. Originating from schistosomiasis endemic and non-endemic areas, as well as laboratory bred voles have the same resistance to Schistosoma japo
Externí odkaz:
https://doaj.org/article/b65c1f15907542d0bae5efd096f96657
Autor:
Xie, Jianyun, Chen, Yanqing, Fang, Yezhou, Sun, Jian, Tong, Jie, Wang, Ning, Liang, Peng, Xue, Hailin
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p1266-1270, 5p
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2024, Vol. 55 Issue 1, p619-622, 4p
Akademický článek
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Autor:
Xie, Jianyun, Chen, Yanqing, Fang, Yezhou, Sun, Jian, Tong, Jie, Wang, Ning, Liang, Peng, Xue, Hailin
Publikováno v:
SID Symposium Digest of Technical Papers; June 2024, Vol. 55 Issue: 1 p1266-1270, 5p
Autor:
HUO, Peirong, XU, Jingyi, XIE, Jianyun, ZUO, Xiongcan, TANG, Wulijibaier, ZHANG, Yongqiang, XIAO, Zhenhong, ZHAO, Shun, XUE, Hailin
Publikováno v:
SID Symposium Digest of Technical Papers; Apr2024 Suppl 1, Vol. 55 Issue 1, p1017-1020, 4p
Publikováno v:
SID Symposium Digest of Technical Papers; Apr2024 Suppl 1, Vol. 55 Issue 1, p804-807, 4p
Autor:
Zhang, Hao, Fang, YeZhou, Xie, JianYun, Shao, Xibin, Xue, Hailin, Dong, Xue, Tian, WenHong, Yao, Lei, Wang, QiuLi, Sun, Jian, LI, Feng, Wang, ZhiQiang
Publikováno v:
SID Symposium Digest of Technical Papers; Jun2023, Vol. 54 Issue 1, p40-43, 4p
Publikováno v:
SID Symposium Digest of Technical Papers. 52:739-741