Zobrazeno 1 - 10
of 250
pro vyhledávání: '"X.J Ning"'
Publikováno v:
Acta Horticulturae. :295-300
The objective of this study was to figure out the effects of different dilution ratios of biogas slurry on the growth and yield of tomato under the same N input in greenhouse cultivation. The experiment was carried out with greenhouse tomato grown in
Publikováno v:
Acta Horticulturae. :989-994
Publikováno v:
Materials Science and Engineering: B. 134:165-171
A selective SiGe epitaxial growth for strained CMOS Si technology was developed for 65 nm logic technology generation that integrates with Ni silicidation. A 36% device performance improvement for PMOS devices was achieved using this technology. Key
Autor:
David L. Rath, Rainer Florian Schnabel, T. Joseph, Kenneth P. Rodbell, Lynne Gignac, R. G. Filippi, X.J Ning, Chenming Hu, Gregory Costrini, Timothy D. Sullivan, Stefan Weber, G. Stojakovic, Lawrence A. Clevenger, Edward W. Kiewra, Roy C. Iggulden, M. Gribelyuk, R.V.S.S.N. Ravikumar, T. Kane, Jeff Gambino
Publikováno v:
Thin Solid Films. 388:303-314
The electromigration behavior and microstructural features of AlCu Dual Damascene lines are compared to those of AlCu metal reactively ion etched (RIE) lines. Test structures consist of 0.18-, 0.35- and 1.33-μm-wide lines terminated by W diffusion b
Autor:
D. Tobben, G.Y. Lee, Roy C. Iggulden, Stefan J. Weber, Maria Ronay, Jeff Gambino, Zhijian Lu, R.F. Schnabel, Clevenger Leigh Anne H, Gregory Costrini, R. Ramachandran, X.J. Ning, R. G. Filippi, Chenting Lin, David M. Dobuzinsky
Publikováno v:
Microelectronic Engineering. 50:265-270
This paper presents an overview of issues associated with Al dual damascene process technology. Different integration schemes are discussed and characteristics of metal fill, planarization and reliability are highlighted. Finally, a comparison is mad
Publikováno v:
Acta Materialia. 44:2265-2283
Low temperature (20–900°C) plastic deformation in TiC 0.91 single crystals has been studied using microindentations on (111), (001) and (110) surfaces, the dislocation structures around microindents being characterized by transmission electron mic
Autor:
X.J. Ning, Pirouz Pirouz
Publikováno v:
Acta Materialia. 44:2127-2143
The study of different stages of boron diffusion by plan-view and cross-sectional transmission electron microscopy shows that, as in the classical model of Matthews, misfit dislocation half-loops are initially generated at the surface. The Burgers ve
Publikováno v:
Journal of Crystal Growth. 158:480-490
The morphology and microstructure of 3C-SiC thin films grown on Si(111) substrate by chemical vapor deposition at ambient pressure has been investigated. Hexamethyldisilane (HMDS) was used as the source gas and a 8% H 2 + Ar mixture as the carrier ga
Autor:
Wang, Yuhao1 (AUTHOR) wyh13068006490@163.com, Yin, Chengjie1 (AUTHOR) yinchengjie2001@163.com, Wang, Jingkuan1 (AUTHOR) wjk18253088030@163.com, Ji, Xiaohui1 (AUTHOR) wfcljxh@163.com, Liu, Xinwei1,2 (AUTHOR) 200501065@qau.edu.cn
Publikováno v:
Agronomy. Jul2024, Vol. 14 Issue 7, p1546. 14p.
Publikováno v:
International Thermal Spray Conference.
In this study, Al-Sn binary alloy coatings were prepared with Al-5wt.%Sn (Al-5Sn) and Al-10wt.%Sn (Al-10Sn) gas atomized powders by low pressure and high pressure cold spray process. The microstructure and microhardness of the coatings were character