Zobrazeno 1 - 2
of 2
pro vyhledávání: '"X. T. Pham Phu"'
Publikováno v:
Surface Science. 603:109-116
We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains domin
Publikováno v:
Phs. Rev. E
Phs. Rev. E, 2009, 79, pp.061106. ⟨10.1103/PhysRevE.79.061106⟩
Phs. Rev. E, 2009, 79, pp.061106. ⟨10.1103/PhysRevE.79.061106⟩
In the bulk state, the Ising FCC antiferromagnet is fully frustrated and is known to have a very strong first-order transition. In this paper, we study the nature of this phase transition in the case of a thin film, as a function of the film thicknes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d9e531aa7005930bf7d7a0b954f8a00f