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pro vyhledávání: '"X. Kruger"'
Autor:
Silvio Elton, Kris Van de Rostyne, Weimin Gao, Jacques Charlier, Christ Glorieux, X. Kruger, Walter Lauriks, Jan Thoen
Publikováno v:
The Journal of the Acoustical Society of America. 105:955-955
Depth profiling of residual stress in steel is of great interest in many practical applications. Conventional techniques are either destructive (x‐ray diffraction and hole drilling) or with obvious restriction (Barkhausen noise). This paper present
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf878b864d42ac0f2e8f8503880eb4ec
https://doi.org/10.1121/1.425764
https://doi.org/10.1121/1.425764
