Zobrazeno 1 - 10
of 51
pro vyhledávání: '"X. F. Zong"'
Publikováno v:
The Journal of Chemical Physics. 110:9765-9768
An ab initio calculation is carried out to investigate the optical origin of highly-efficient and selective trans↔cis isomerizations in a short polyene. It is found that the highly-efficient isomerization is closely related to the highly-selective
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5675521474d26228269c425148109b69
https://doi.org/10.1063/1.478942
https://doi.org/10.1063/1.478942
Publikováno v:
Journal of Electronics Manufacturing. :173-179
The occurrence of flux residue is a manufacturing and reliability concern for flip chip assemblies. In this paper, removal of flux residue by laser cleaning before chip attachment to board is carried out. In the flip chip process, 63%Sn37%Pb solder p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1444449345bbf3afdaa7207be506e001
https://doi.org/10.1142/s0960313198000161
https://doi.org/10.1142/s0960313198000161
Publikováno v:
Scopus-Elsevier
Nickel-doped Al2O3 (sapphire) crystals have been studied using optical absorption and transmission electron microscopy. After reduction at elevated temperatures in a hydrogen atmosphere, these crystals exhibit a dark colouration. Our results indicate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7371c4395f9a9381b2dae9557dcd6f5
https://doi.org/10.1080/01418619708209980
https://doi.org/10.1080/01418619708209980
Publikováno v:
Physics Letters A. 220:275-280
By normal mode analysis a novel picture of the relaxation process of charge transfer in C 60 is discovered. It is found that after one electron is transferred to C 60 , only a few normal modes with even parity can be invoked. A Jahn-Teller (J-T) theo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed166249fbc1886791c14c296f2fbd00
https://doi.org/10.1016/0375-9601(96)00544-0
https://doi.org/10.1016/0375-9601(96)00544-0
Autor:
C. H. Sellers, B. D. Evans, X. F. Zong, Yi Chen, Y. Chen, Renjun Zhang, Roberto González, Zhong-chi Wu, Jane G. Zhu, Song Liu, Cheng-Fu Shen
Publikováno v:
Journal of Nuclear Materials. 219:176-181
Kesternich et al. and Jung et al. have recently raised serious questions as to whether past investigations of permanent radiation induced electrical degradation (RIED) of ceramics were actually monitoring bulk effects, as claimed. Their evidence to t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be393ce35a5f6b943b065cc07de2691a
https://doi.org/10.1016/0022-3115(94)00397-1
https://doi.org/10.1016/0022-3115(94)00397-1
Autor:
B.D. Evans, J.J. O'Dwyer, Frank W. Clinard, R. Gonzalez, X. F. Zong, E.H. Farnum, Roger H. French, Y. Chen, F.W. Wiffen
Publikováno v:
Journal of Nuclear Materials. 217:32-47
This report addresses a recently reported phenomenon — that a simultaneous application of energetic particle radiation, electric field, and elevated temperature for an extended period of time has a permanent adverse effect on insulating ceramics, i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3da76ae97c62d1a497423c018e03fcff
https://doi.org/10.1016/0022-3115(94)90302-6
https://doi.org/10.1016/0022-3115(94)90302-6
Autor:
Y. Chen, X. F. Zong, Yi Chen, Cheng-Fu Shen, C. H. Sellers, Zhong-chi Wu, Song Liu, B. D. Evans, Roberto González
Publikováno v:
Physical Review B. 49:15514-15524
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1958a864eea3030a36db8e5c8a02077
https://doi.org/10.1103/physrevb.49.15514
https://doi.org/10.1103/physrevb.49.15514
Publikováno v:
Philosophical Magazine A. 67:207-216
Transmission electron microscopy, X-ray microanalysis and optical absorption measurements have been used to characterize strained and unstrained regions in as-grown and subsequently thermochemically reduced yttrium aluminium garnet crystals. As the t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00c7be51e51ef454b41897a9d0f80936
https://doi.org/10.1080/01418619308207152
https://doi.org/10.1080/01418619308207152
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