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pro vyhledávání: '"Wu, Zhuojie"'
Autor:
Shen, Xin, Du, Heming, Sheng, Hongwei, Wang, Shuyun, Chen, Hui, Chen, Huiqiang, Wu, Zhuojie, Du, Xiaobiao, Ying, Jiaying, Lu, Ruihan, Xu, Qingzheng, Yu, Xin
Isolated Sign Language Recognition (ISLR) focuses on identifying individual sign language glosses. Considering the diversity of sign languages across geographical regions, developing region-specific ISLR datasets is crucial for supporting communicati
Externí odkaz:
http://arxiv.org/abs/2410.19488
Autor:
Du, Xiaobiao, Sun, Haiyang, Wang, Shuyun, Wu, Zhuojie, Sheng, Hongwei, Ying, Jiaying, Lu, Ming, Zhu, Tianqing, Zhan, Kun, Yu, Xin
3D cars are commonly used in self-driving systems, virtual/augmented reality, and games. However, existing 3D car datasets are either synthetic or low-quality, presenting a significant gap toward the high-quality real-world 3D car datasets and limiti
Externí odkaz:
http://arxiv.org/abs/2406.04875
Efficient medical image segmentation aims to provide accurate pixel-wise predictions for medical images with a lightweight implementation framework. However, lightweight frameworks generally fail to achieve superior performance and suffer from poor g
Externí odkaz:
http://arxiv.org/abs/2207.12995
Face inpainting aims to complete the corrupted regions of the face images, which requires coordination between the completed areas and the non-corrupted areas. Recently, memory-oriented methods illustrate great prospects in the generation related tas
Externí odkaz:
http://arxiv.org/abs/2204.02824
3D to 2D retinal vessel segmentation is a challenging problem in Optical Coherence Tomography Angiography (OCTA) images. Accurate retinal vessel segmentation is important for the diagnosis and prevention of ophthalmic diseases. However, making full u
Externí odkaz:
http://arxiv.org/abs/2108.11695
Akademický článek
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Autor:
Wu, Zhuojie
The continuing scaling of integrated circuits beyond 22nm technology node poses increasing challenges to Electromigration (EM) reliability for Cu on-chip interconnects. First, the width of Cu lines in advanced technology nodes is less than the electr
Externí odkaz:
http://hdl.handle.net/2152/25145
Akademický článek
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