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Autor:
Jungwan Choi, Seungho Park, Woori Do, Jin-Ha Hwang, Seung-Muk Bae, Byung-Kuk Kim, Hyoung-June Kim, Won-Beom Jin
Publikováno v:
Materials Research Bulletin. 58:164-168
Boron-implanted polycrystalline Si thin films on glass substrates were subjected to a short duration (1 ms) of intense visible light irradiation generated via a high-powered Xe arc lamp. The disordered Si atomic structure absorbs the intense visible
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d1eb09a2137b131acf6358a7274d4ff
https://doi.org/10.1016/j.materresbull.2014.04.047
https://doi.org/10.1016/j.materresbull.2014.04.047
